As the probability of fault occurrence increases with the advance of memory density and capacity, redundancy analysis (RA) is widely used for memory yield. However, the conventional RAs progress unnecessary solution search stages since they are applied per memory bank. It results in increase of the repair time. In this paper, redundancy analysis optimization with clustered known solutions (ROCK) is proposed for high speed repair. It progresses repair solution search considering multiple memory banks. During the repair solution search, RA using ROCK finds duplicated solution search stages based on a fault grouping method. After then, RA using ROCK enrolls the duplicated solution search stages as library and utilizes the library instead of progressing the duplicated solution search stages. It can highly reduce the repair time without any repair rate degradation.
|Title of host publication||Proceedings - International SoC Design Conference, ISOCC 2020|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||2|
|Publication status||Published - 2020 Oct 21|
|Event||17th International System-on-Chip Design Conference, ISOCC 2020 - Yeosu, Korea, Republic of|
Duration: 2020 Oct 21 → 2020 Oct 24
|Name||Proceedings - International SoC Design Conference, ISOCC 2020|
|Conference||17th International System-on-Chip Design Conference, ISOCC 2020|
|Country||Korea, Republic of|
|Period||20/10/21 → 20/10/24|
Bibliographical noteFunding Information:
This work was supported by the National Research Foundation of Korea(NRF) grant funded by the Korea(MSIT) (No. 2019R1A2C3011079).
© 2020 IEEE.
All Science Journal Classification (ASJC) codes
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
- Artificial Intelligence
- Hardware and Architecture