Refractive index profiling of a core-doped photonic crystal fiber

Youngchun Youk, Soan Kim, Kyunghwan Oh, Dug Young Kim

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Direct refractive index profiling for a core-doped photonic crystal fiber with complex and nonsymmetric refractive index structure has been demonstrated for the first time. A new index profiling technique based on a reflectivity measurement technique using a confocal microscope has been employed. This improved, straightforward, and robust method enables us to measure the index structure of a complex structured fiber with high refractive index precision and spatial resolution.

Original languageEnglish
Pages (from-to)810-812
Number of pages3
JournalIEEE Photonics Technology Letters
Volume19
Issue number11
DOIs
Publication statusPublished - 2007 Jun 1

Bibliographical note

Funding Information:
Manuscript received October 19, 2006; revised February 13, 2007. This work was supported by Creative Research Initiatives (3D Nano Optical Imaging System Group) of MOST/KOSEF. Y. Youk and D. Y. Kim are with the Department of Information and Communications, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea (e-mail: ycyouk@gist.ac.kr). S. Kim is with the Advanced Photonics Research Institute, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea. K. Oh is with the Department of Applied Physics, Yonsei University, Seoul 120-749, Republic of Korea. Color versions of one or more of the figures in this letter are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/LPT.2007.895439 Fig. 1. Schematic diagram of (a) the lattice profile and structure parameters, (b) the core defect structure with a germanosilicate ring, and (c) the cladding air hole structure with P O and F codoped rings.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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