Direct refractive index profiling for a core-doped photonic crystal fiber with complex and nonsymmetric refractive index structure has been demonstrated for the first time. A new index profiling technique based on a reflectivity measurement technique using a confocal microscope has been employed. This improved, straightforward, and robust method enables us to measure the index structure of a complex structured fiber with high refractive index precision and spatial resolution.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering