Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems

Keun Ho Rhew, Su Chang Jeon, O. Kyun Kwon, Dae Hee Lee, Byung Soo Too, Ilgu Yun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, the long-term reliability of all monolithic 1.5.5-μm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variations of properties that depend on the operating conditions are characterized via the threshold current, the dark current, and the optical output power. The median device lifetime is extrapolated and the activation energy of the degradation mechanism for the VCSEL test structures is calculated. From these results, the long-term reliability of the VCSEL test structures for high-speed optical, communication systems can be determined.

Original languageEnglish
Title of host publication2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual
Pages476-479
Number of pages4
DOIs
Publication statusPublished - 2007 Sep 25
Event45th Annual IEEE International Reliability Physics Symposium 2007, IRPS - Phoenix, AZ, United States
Duration: 2007 Apr 152007 Apr 19

Publication series

NameAnnual Proceedings - Reliability Physics (Symposium)
ISSN (Print)0099-9512

Other

Other45th Annual IEEE International Reliability Physics Symposium 2007, IRPS
CountryUnited States
CityPhoenix, AZ
Period07/4/1507/4/19

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Fingerprint Dive into the research topics of 'Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems'. Together they form a unique fingerprint.

  • Cite this

    Rhew, K. H., Jeon, S. C., Kwon, O. K., Lee, D. H., Too, B. S., & Yun, I. (2007). Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems. In 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual (pp. 476-479). [4227678] (Annual Proceedings - Reliability Physics (Symposium)). https://doi.org/10.1109/RELPHY.2007.369937