Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems

Keun Ho Rhew, Su Chang Jeon, O. Kyun Kwon, Dae Hee Lee, Byung Soo Too, Ilgu Yun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, the long-term reliability of all monolithic 1.5.5-μm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variations of properties that depend on the operating conditions are characterized via the threshold current, the dark current, and the optical output power. The median device lifetime is extrapolated and the activation energy of the degradation mechanism for the VCSEL test structures is calculated. From these results, the long-term reliability of the VCSEL test structures for high-speed optical, communication systems can be determined.

Original languageEnglish
Title of host publication2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual
Pages476-479
Number of pages4
DOIs
Publication statusPublished - 2007 Sep 25
Event45th Annual IEEE International Reliability Physics Symposium 2007, IRPS - Phoenix, AZ, United States
Duration: 2007 Apr 152007 Apr 19

Publication series

NameAnnual Proceedings - Reliability Physics (Symposium)
ISSN (Print)0099-9512

Other

Other45th Annual IEEE International Reliability Physics Symposium 2007, IRPS
CountryUnited States
CityPhoenix, AZ
Period07/4/1507/4/19

Fingerprint

Surface emitting lasers
Optical communication
Communication systems
Dark currents
Activation energy
Degradation
Temperature

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Rhew, K. H., Jeon, S. C., Kwon, O. K., Lee, D. H., Too, B. S., & Yun, I. (2007). Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems. In 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual (pp. 476-479). [4227678] (Annual Proceedings - Reliability Physics (Symposium)). https://doi.org/10.1109/RELPHY.2007.369937
Rhew, Keun Ho ; Jeon, Su Chang ; Kwon, O. Kyun ; Lee, Dae Hee ; Too, Byung Soo ; Yun, Ilgu. / Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems. 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. 2007. pp. 476-479 (Annual Proceedings - Reliability Physics (Symposium)).
@inproceedings{b43a0a6b7431456a8be1a3c76a3baf37,
title = "Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems",
abstract = "In this paper, the long-term reliability of all monolithic 1.5.5-μm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variations of properties that depend on the operating conditions are characterized via the threshold current, the dark current, and the optical output power. The median device lifetime is extrapolated and the activation energy of the degradation mechanism for the VCSEL test structures is calculated. From these results, the long-term reliability of the VCSEL test structures for high-speed optical, communication systems can be determined.",
author = "Rhew, {Keun Ho} and Jeon, {Su Chang} and Kwon, {O. Kyun} and Lee, {Dae Hee} and Too, {Byung Soo} and Ilgu Yun",
year = "2007",
month = "9",
day = "25",
doi = "10.1109/RELPHY.2007.369937",
language = "English",
isbn = "1424409195",
series = "Annual Proceedings - Reliability Physics (Symposium)",
pages = "476--479",
booktitle = "2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual",

}

Rhew, KH, Jeon, SC, Kwon, OK, Lee, DH, Too, BS & Yun, I 2007, Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems. in 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual., 4227678, Annual Proceedings - Reliability Physics (Symposium), pp. 476-479, 45th Annual IEEE International Reliability Physics Symposium 2007, IRPS, Phoenix, AZ, United States, 07/4/15. https://doi.org/10.1109/RELPHY.2007.369937

Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems. / Rhew, Keun Ho; Jeon, Su Chang; Kwon, O. Kyun; Lee, Dae Hee; Too, Byung Soo; Yun, Ilgu.

2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. 2007. p. 476-479 4227678 (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems

AU - Rhew, Keun Ho

AU - Jeon, Su Chang

AU - Kwon, O. Kyun

AU - Lee, Dae Hee

AU - Too, Byung Soo

AU - Yun, Ilgu

PY - 2007/9/25

Y1 - 2007/9/25

N2 - In this paper, the long-term reliability of all monolithic 1.5.5-μm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variations of properties that depend on the operating conditions are characterized via the threshold current, the dark current, and the optical output power. The median device lifetime is extrapolated and the activation energy of the degradation mechanism for the VCSEL test structures is calculated. From these results, the long-term reliability of the VCSEL test structures for high-speed optical, communication systems can be determined.

AB - In this paper, the long-term reliability of all monolithic 1.5.5-μm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variations of properties that depend on the operating conditions are characterized via the threshold current, the dark current, and the optical output power. The median device lifetime is extrapolated and the activation energy of the degradation mechanism for the VCSEL test structures is calculated. From these results, the long-term reliability of the VCSEL test structures for high-speed optical, communication systems can be determined.

UR - http://www.scopus.com/inward/record.url?scp=34548720394&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34548720394&partnerID=8YFLogxK

U2 - 10.1109/RELPHY.2007.369937

DO - 10.1109/RELPHY.2007.369937

M3 - Conference contribution

AN - SCOPUS:34548720394

SN - 1424409195

SN - 9781424409198

T3 - Annual Proceedings - Reliability Physics (Symposium)

SP - 476

EP - 479

BT - 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual

ER -

Rhew KH, Jeon SC, Kwon OK, Lee DH, Too BS, Yun I. Reliability assessment of 1.55-μm vertical cavity surface emitting lasers for optical communication systems. In 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. 2007. p. 476-479. 4227678. (Annual Proceedings - Reliability Physics (Symposium)). https://doi.org/10.1109/RELPHY.2007.369937