Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications

Han Sung Joo, Su Chang Jeon, Bongyong Lee, Yong Hwan Kwon, Joong Seon Choe, Ilgu Yun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

As a summary, the reliability testing of mesa InGaAs WGPDs from the viewpoint of evaluation long-term reliability has been investigated using the accelerated life tests. From the reliability testing results, it was found that the WGPD structure yielded devices that exhibited the median lifetime of much longer than 106 h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gb/s optical receiver modules.

Original languageEnglish
Title of host publicationIMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages73-74
Number of pages2
ISBN (Electronic)0780384237, 9780780384231
DOIs
Publication statusPublished - 2004 Jan 1
Event2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 - Kyoto, Japan
Duration: 2004 Jul 262004 Jul 28

Other

Other2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004
CountryJapan
CityKyoto
Period04/7/2604/7/28

Fingerprint

Optical receivers
Photodiodes
Waveguides
Testing

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Joo, H. S., Jeon, S. C., Lee, B., Kwon, Y. H., Choe, J. S., & Yun, I. (2004). Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. In IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai (pp. 73-74). [1566414] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMFEDK.2004.1566414
Joo, Han Sung ; Jeon, Su Chang ; Lee, Bongyong ; Kwon, Yong Hwan ; Choe, Joong Seon ; Yun, Ilgu. / Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Institute of Electrical and Electronics Engineers Inc., 2004. pp. 73-74
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Joo, HS, Jeon, SC, Lee, B, Kwon, YH, Choe, JS & Yun, I 2004, Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. in IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai., 1566414, Institute of Electrical and Electronics Engineers Inc., pp. 73-74, 2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004, Kyoto, Japan, 04/7/26. https://doi.org/10.1109/IMFEDK.2004.1566414

Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. / Joo, Han Sung; Jeon, Su Chang; Lee, Bongyong; Kwon, Yong Hwan; Choe, Joong Seon; Yun, Ilgu.

IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Institute of Electrical and Electronics Engineers Inc., 2004. p. 73-74 1566414.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Joo HS, Jeon SC, Lee B, Kwon YH, Choe JS, Yun I. Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. In IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Institute of Electrical and Electronics Engineers Inc. 2004. p. 73-74. 1566414 https://doi.org/10.1109/IMFEDK.2004.1566414