Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications

Han Sung Joo, Su Chang Jeon, Bongyong Lee, Yong Hwan Kwon, Joong Seon Choe, Ilgu Yun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

As a summary, the reliability testing of mesa InGaAs WGPDs from the viewpoint of evaluation long-term reliability has been investigated using the accelerated life tests. From the reliability testing results, it was found that the WGPD structure yielded devices that exhibited the median lifetime of much longer than 106 h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gb/s optical receiver modules.

Original languageEnglish
Title of host publicationIMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai
EditorsHiroshi Nozawa
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages73-74
Number of pages2
ISBN (Electronic)0780384237, 9780780384231
DOIs
Publication statusPublished - 2004
Event2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 - Kyoto, Japan
Duration: 2004 Jul 262004 Jul 28

Publication series

NameIMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai

Other

Other2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004
CountryJapan
CityKyoto
Period04/7/2604/7/28

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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