Reliability testing of single diffused planar InP/InGaAs avalanche photodiodes

Jihoun Jung, Yong Hwan Kwon, Kyung Sook Hyun, Ilgu Yun

Research output: Contribution to journalArticle

Abstract

This paper presents the reliability of single diffused planar InP/InGaAs avalanche photodiodes (APDs), which is very crucial for the commercial 10-Gb/s optical receiver application. A versatile design for the planar InP/InGaAs APDs and bias-temperature tests to evaluate long-term reliability at temperature from 200 to 250°C. The reliability is examined by accelerated life tests by monitoring dark current and breakdown voltage. The lifetime of the APDs is estimated by a degradation activation energy. Based on the test results, it is concluded that the single diffused planar InP/InGaAs APDs show the sufficient reliability for practical 10-Gb/s optical receivers.

Original languageEnglish
Article number34
Pages (from-to)193-194
Number of pages2
JournalProceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium
DOIs
Publication statusPublished - 2002 Jan 1

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Avalanche photodiodes
Optical receivers
Testing
Dark currents
Electric breakdown
Activation energy
Degradation
Temperature
Monitoring

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

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abstract = "This paper presents the reliability of single diffused planar InP/InGaAs avalanche photodiodes (APDs), which is very crucial for the commercial 10-Gb/s optical receiver application. A versatile design for the planar InP/InGaAs APDs and bias-temperature tests to evaluate long-term reliability at temperature from 200 to 250°C. The reliability is examined by accelerated life tests by monitoring dark current and breakdown voltage. The lifetime of the APDs is estimated by a degradation activation energy. Based on the test results, it is concluded that the single diffused planar InP/InGaAs APDs show the sufficient reliability for practical 10-Gb/s optical receivers.",
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Reliability testing of single diffused planar InP/InGaAs avalanche photodiodes. / Jung, Jihoun; Kwon, Yong Hwan; Hyun, Kyung Sook; Yun, Ilgu.

In: Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium, 01.01.2002, p. 193-194.

Research output: Contribution to journalArticle

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