Reliable semi-transparent pentacene thin-film transistors with polymer gate dielectric layers cured at an optimum temperature

D. K. Hwang, Ji Hoon Park, Jeong M. Choi, Jiyoul Lee, S. H. Jeong, Eugene Kim, Jae Hoon Kim, Seongil Im

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report on the insulator-charging-effects of poly-4-vinylphenol (PVP) gate dielectric on the reliabilities of pentacene thin-film transistors (TFTs), Our PVP films were prepared by spin coating and curing at various temperatures (155, 175, and 200 °C). Evaluated using Au/PVP/p+-Si structures, the dielectric strength of PVP films cured at 175 °C was superior to those of the other PVP films cured at different temperatures. Although saturation current and field mobility (∼0,13 cm2/Vs) obtained from a TFT with PVP film cured at 200 °C appeared higher than those (∼0.07 cm 2/Vs) from the device with 175 °C-cured polymer film, the TFT prepared at 200 °C revealed a low on/off current ratio of less than 10 4 due to its high off-state current and also unreliable saturation behavior under repetitive gate voltage sweep, The unreliable behavior is due to the dielectric-charging caused by gate-electron-injection. We thus conclude that there are some optimal PVP-curing conditions to improve the reliability of pentacene TFT.

Original languageEnglish
Title of host publicationMaterials for Transparent Electronics
PublisherMaterials Research Society
Pages47-52
Number of pages6
ISBN (Print)1558998608, 9781558998605
DOIs
Publication statusPublished - 2005 Jan 1
Event2005 MRS Fall Meeting - Boston, MA, United States
Duration: 2005 Nov 282005 Dec 2

Publication series

NameMaterials Research Society Symposium Proceedings
Volume905
ISSN (Print)0272-9172

Other

Other2005 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period05/11/2805/12/2

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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    Hwang, D. K., Park, J. H., Choi, J. M., Lee, J., Jeong, S. H., Kim, E., Kim, J. H., & Im, S. (2005). Reliable semi-transparent pentacene thin-film transistors with polymer gate dielectric layers cured at an optimum temperature. In Materials for Transparent Electronics (pp. 47-52). (Materials Research Society Symposium Proceedings; Vol. 905). Materials Research Society. https://doi.org/10.1557/proc-0905-dd05-15