Residual DC characteristic on twisted nematic liquid crystal display on the polyimide surface by the thermal stress

Hyun Chan Moon, Yu Han Bae, Jeoung Yeon Hwang, Kang Woo Kim, Dae Shik Seo, Yong Pil Park

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In this study, the threshold voltage and the response time of thermal stressed TN-LCDs showed the same performances on none thermal stressed TN-LCDs. There was little change in TN cells. Also, while increasing thermal stress time, the transmittances of TN-LCDs on the rubbed PI surface were almost the same, but the thermal stability of TN cell was deteriorated.

Original languageEnglish
Pages (from-to)161-166
Number of pages6
JournalMolecular Crystals and Liquid Crystals
Volume443
DOIs
Publication statusPublished - 2005 Dec 1

Fingerprint

Nematic liquid crystals
thermal stresses
Liquid crystal displays
polyimides
Polyimides
Thermal stress
direct current
liquid crystals
cells
threshold voltage
transmittance
thermal stability
Threshold voltage
Thermodynamic stability
Hot Temperature

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Moon, Hyun Chan ; Bae, Yu Han ; Hwang, Jeoung Yeon ; Kim, Kang Woo ; Seo, Dae Shik ; Park, Yong Pil. / Residual DC characteristic on twisted nematic liquid crystal display on the polyimide surface by the thermal stress. In: Molecular Crystals and Liquid Crystals. 2005 ; Vol. 443. pp. 161-166.
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Residual DC characteristic on twisted nematic liquid crystal display on the polyimide surface by the thermal stress. / Moon, Hyun Chan; Bae, Yu Han; Hwang, Jeoung Yeon; Kim, Kang Woo; Seo, Dae Shik; Park, Yong Pil.

In: Molecular Crystals and Liquid Crystals, Vol. 443, 01.12.2005, p. 161-166.

Research output: Contribution to journalArticle

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AU - Bae, Yu Han

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AU - Seo, Dae Shik

AU - Park, Yong Pil

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