Response time performance estimation in smartphones applying dynamic voltage & frequency scaling and completely fair scheduler

Raymond C. Garcia, Jong Moon Chung, Sung Woong Jo, Taeyoung Ha, Taehyun Kyong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper, a response time performance estimation scheme is proposed for smartphones applying dynamic voltage & frequency scaling (DVFS) at the central processing unit (CPU) and completely fair scheduler (CFS) at the Linux kernel. DVFS techniques influence the overall time performance of the smartphone since changes in CPU operational frequency will change all aspects of the CPUs responsiveness and access speed for task execution. CFS also has significant influence in task execution at the Linux kernel. Results show the effectiveness of the proposed scheme in estimating the instantaneous response time on a LG Optimus G smartphone.

Original languageEnglish
Title of host publicationISCE 2014 - 18th IEEE International Symposium on Consumer Electronics
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479945924
DOIs
Publication statusPublished - 2014 Jan 1
Event18th IEEE International Symposium on Consumer Electronics, ISCE 2014 - Jeju, Korea, Republic of
Duration: 2014 Jun 222014 Jun 25

Publication series

NameProceedings of the International Symposium on Consumer Electronics, ISCE

Other

Other18th IEEE International Symposium on Consumer Electronics, ISCE 2014
CountryKorea, Republic of
CityJeju
Period14/6/2214/6/25

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Garcia, R. C., Chung, J. M., Jo, S. W., Ha, T., & Kyong, T. (2014). Response time performance estimation in smartphones applying dynamic voltage & frequency scaling and completely fair scheduler. In ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics [6884484] (Proceedings of the International Symposium on Consumer Electronics, ISCE). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCE.2014.6884484