Review of contact-resistance analysis in nano-material

Jae Young Park, Jinsoo Cho, Seong Chan Jun

Research output: Contribution to journalReview article

4 Citations (Scopus)

Abstract

Recently, investigating the unique electrical properties of low-dimensional (One- and two-dimensional) materials as alternatives to silicon has become popular among researchers. In order to observe the intrinsic properties and device performance, it is essential to elucidate the electron transport at the electrode/nanomaterial interface. This study reviews various current approaches used to evaluate the contact resistance of electronic devices based on the most representative low-dimensional nano-materials such as carbon nanotubes, nanowires, graphene and molybdenum disulfide. Various analytical factors that have generally not been considered in conventional electronics are introduced to define the contact resistance within the nano-meter scale. Additionally, a comparison of three different methods for determining the contact resistance to interpret experimental data is conducted. Finally, several attempted efforts to reduce the contact resistance are presented.

Original languageEnglish
Pages (from-to)539-547
Number of pages9
JournalJournal of Mechanical Science and Technology
Volume32
Issue number2
DOIs
Publication statusPublished - 2018 Feb 1

Fingerprint

Contact resistance
Nanostructured materials
Graphene
Molybdenum
Nanowires
Carbon nanotubes
Electric properties
Electronic equipment
Silicon
Electrodes

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering

Cite this

@article{66fc2ba65c0f43e789db73a113839b43,
title = "Review of contact-resistance analysis in nano-material",
abstract = "Recently, investigating the unique electrical properties of low-dimensional (One- and two-dimensional) materials as alternatives to silicon has become popular among researchers. In order to observe the intrinsic properties and device performance, it is essential to elucidate the electron transport at the electrode/nanomaterial interface. This study reviews various current approaches used to evaluate the contact resistance of electronic devices based on the most representative low-dimensional nano-materials such as carbon nanotubes, nanowires, graphene and molybdenum disulfide. Various analytical factors that have generally not been considered in conventional electronics are introduced to define the contact resistance within the nano-meter scale. Additionally, a comparison of three different methods for determining the contact resistance to interpret experimental data is conducted. Finally, several attempted efforts to reduce the contact resistance are presented.",
author = "Park, {Jae Young} and Jinsoo Cho and Jun, {Seong Chan}",
year = "2018",
month = "2",
day = "1",
doi = "10.1007/s12206-018-0101-9",
language = "English",
volume = "32",
pages = "539--547",
journal = "Journal of Mechanical Science and Technology",
issn = "1738-494X",
publisher = "Korean Society of Mechanical Engineers",
number = "2",

}

Review of contact-resistance analysis in nano-material. / Park, Jae Young; Cho, Jinsoo; Jun, Seong Chan.

In: Journal of Mechanical Science and Technology, Vol. 32, No. 2, 01.02.2018, p. 539-547.

Research output: Contribution to journalReview article

TY - JOUR

T1 - Review of contact-resistance analysis in nano-material

AU - Park, Jae Young

AU - Cho, Jinsoo

AU - Jun, Seong Chan

PY - 2018/2/1

Y1 - 2018/2/1

N2 - Recently, investigating the unique electrical properties of low-dimensional (One- and two-dimensional) materials as alternatives to silicon has become popular among researchers. In order to observe the intrinsic properties and device performance, it is essential to elucidate the electron transport at the electrode/nanomaterial interface. This study reviews various current approaches used to evaluate the contact resistance of electronic devices based on the most representative low-dimensional nano-materials such as carbon nanotubes, nanowires, graphene and molybdenum disulfide. Various analytical factors that have generally not been considered in conventional electronics are introduced to define the contact resistance within the nano-meter scale. Additionally, a comparison of three different methods for determining the contact resistance to interpret experimental data is conducted. Finally, several attempted efforts to reduce the contact resistance are presented.

AB - Recently, investigating the unique electrical properties of low-dimensional (One- and two-dimensional) materials as alternatives to silicon has become popular among researchers. In order to observe the intrinsic properties and device performance, it is essential to elucidate the electron transport at the electrode/nanomaterial interface. This study reviews various current approaches used to evaluate the contact resistance of electronic devices based on the most representative low-dimensional nano-materials such as carbon nanotubes, nanowires, graphene and molybdenum disulfide. Various analytical factors that have generally not been considered in conventional electronics are introduced to define the contact resistance within the nano-meter scale. Additionally, a comparison of three different methods for determining the contact resistance to interpret experimental data is conducted. Finally, several attempted efforts to reduce the contact resistance are presented.

UR - http://www.scopus.com/inward/record.url?scp=85042310231&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85042310231&partnerID=8YFLogxK

U2 - 10.1007/s12206-018-0101-9

DO - 10.1007/s12206-018-0101-9

M3 - Review article

AN - SCOPUS:85042310231

VL - 32

SP - 539

EP - 547

JO - Journal of Mechanical Science and Technology

JF - Journal of Mechanical Science and Technology

SN - 1738-494X

IS - 2

ER -