RF Characterization of Multi-walled carbon nanotube and ZnO film

Jung Han Choi, Insang Song, Joon Hyong Cho, Whankyun Kim, Hyongseo Yoon, Seong Chan Jun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Growing interests on carbon nanotubes (CNTs) and ZnO film let us consider radio frequency characteristics for future employment in electronic devices. Prior to the deployment and development for RF devices, the fundamentals about two materials are investigated. Multi-walled CNTs are characterized up to 50 GHz. Using the measured S-parameters Telegrapher's equivalent circuit models are extracted. And, for the ZnO film the equivalent circuit parameters are obtained as well. The circuit parameters provide the useful criterion to evaluate RF performance.

Original languageEnglish
Title of host publication2011 IEEE MTT-S International Microwave Symposium, IMS 2011
DOIs
Publication statusPublished - 2011 Sep 7
Event2011 IEEE MTT-S International Microwave Symposium, IMS 2011 - Baltimore, MD, United States
Duration: 2011 Jun 52011 Jun 10

Other

Other2011 IEEE MTT-S International Microwave Symposium, IMS 2011
CountryUnited States
CityBaltimore, MD
Period11/6/511/6/10

Fingerprint

Equivalent circuits
Carbon nanotubes
carbon nanotubes
equivalent circuits
Scattering parameters
Networks (circuits)
radio frequencies
electronics

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Radiation
  • Condensed Matter Physics

Cite this

Choi, J. H., Song, I., Cho, J. H., Kim, W., Yoon, H., & Jun, S. C. (2011). RF Characterization of Multi-walled carbon nanotube and ZnO film. In 2011 IEEE MTT-S International Microwave Symposium, IMS 2011 [5972973] https://doi.org/10.1109/MWSYM.2011.5972973
Choi, Jung Han ; Song, Insang ; Cho, Joon Hyong ; Kim, Whankyun ; Yoon, Hyongseo ; Jun, Seong Chan. / RF Characterization of Multi-walled carbon nanotube and ZnO film. 2011 IEEE MTT-S International Microwave Symposium, IMS 2011. 2011.
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Choi, JH, Song, I, Cho, JH, Kim, W, Yoon, H & Jun, SC 2011, RF Characterization of Multi-walled carbon nanotube and ZnO film. in 2011 IEEE MTT-S International Microwave Symposium, IMS 2011., 5972973, 2011 IEEE MTT-S International Microwave Symposium, IMS 2011, Baltimore, MD, United States, 11/6/5. https://doi.org/10.1109/MWSYM.2011.5972973

RF Characterization of Multi-walled carbon nanotube and ZnO film. / Choi, Jung Han; Song, Insang; Cho, Joon Hyong; Kim, Whankyun; Yoon, Hyongseo; Jun, Seong Chan.

2011 IEEE MTT-S International Microwave Symposium, IMS 2011. 2011. 5972973.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Choi JH, Song I, Cho JH, Kim W, Yoon H, Jun SC. RF Characterization of Multi-walled carbon nanotube and ZnO film. In 2011 IEEE MTT-S International Microwave Symposium, IMS 2011. 2011. 5972973 https://doi.org/10.1109/MWSYM.2011.5972973