Rietveld analysis of nano-crystalline MnFe2O4 with electron powder diffraction

Jin Gyu Kim, Jung wook Seo, Jinwoo Cheon, Youn Joong Kim

Research output: Contribution to journalArticle

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Abstract

The structure of nano-crystalline MnFe2O4 was determined and refined with electron powder diffraction data employing the Rietveld refinement technique. A nano-crystalline sample (with average crystal size of about 10.9 nm) was characterized by selected area electron diffraction in an energy-filtering transmission electron microscope operated at 120 kV. All reflection intensities were extracted from a digitized image plate using the program ELD and then used in the course of structure refinements employing the program FULLPROF for the Rietveld analysis. The final structure was refined in space group Fd-3m (# 227) with lattice parameters a=8.3413(7) Å. The reliability factors of the refinement are RF=7.98% and RB=3.55%. Comparison of crystallographic data between electron powder diffraction data and reference data resulted in better agreement with ICSD-56121 rather than with ICSD-28517 which assumes an initial structure model.

Original languageEnglish
Pages (from-to)183-187
Number of pages5
JournalBulletin of the Korean Chemical Society
Volume30
Issue number1
DOIs
Publication statusPublished - 2009 Jan 1

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Rietveld analysis
Crystalline materials
Rietveld refinement
Electrons
Model structures
Electron diffraction
Lattice constants
Electron microscopes
Crystals
manganese ferrite
Powder Diffraction

All Science Journal Classification (ASJC) codes

  • Chemistry(all)

Cite this

Kim, Jin Gyu ; Seo, Jung wook ; Cheon, Jinwoo ; Kim, Youn Joong. / Rietveld analysis of nano-crystalline MnFe2O4 with electron powder diffraction. In: Bulletin of the Korean Chemical Society. 2009 ; Vol. 30, No. 1. pp. 183-187.
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abstract = "The structure of nano-crystalline MnFe2O4 was determined and refined with electron powder diffraction data employing the Rietveld refinement technique. A nano-crystalline sample (with average crystal size of about 10.9 nm) was characterized by selected area electron diffraction in an energy-filtering transmission electron microscope operated at 120 kV. All reflection intensities were extracted from a digitized image plate using the program ELD and then used in the course of structure refinements employing the program FULLPROF for the Rietveld analysis. The final structure was refined in space group Fd-3m (# 227) with lattice parameters a=8.3413(7) {\AA}. The reliability factors of the refinement are RF=7.98{\%} and RB=3.55{\%}. Comparison of crystallographic data between electron powder diffraction data and reference data resulted in better agreement with ICSD-56121 rather than with ICSD-28517 which assumes an initial structure model.",
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Rietveld analysis of nano-crystalline MnFe2O4 with electron powder diffraction. / Kim, Jin Gyu; Seo, Jung wook; Cheon, Jinwoo; Kim, Youn Joong.

In: Bulletin of the Korean Chemical Society, Vol. 30, No. 1, 01.01.2009, p. 183-187.

Research output: Contribution to journalArticle

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AB - The structure of nano-crystalline MnFe2O4 was determined and refined with electron powder diffraction data employing the Rietveld refinement technique. A nano-crystalline sample (with average crystal size of about 10.9 nm) was characterized by selected area electron diffraction in an energy-filtering transmission electron microscope operated at 120 kV. All reflection intensities were extracted from a digitized image plate using the program ELD and then used in the course of structure refinements employing the program FULLPROF for the Rietveld analysis. The final structure was refined in space group Fd-3m (# 227) with lattice parameters a=8.3413(7) Å. The reliability factors of the refinement are RF=7.98% and RB=3.55%. Comparison of crystallographic data between electron powder diffraction data and reference data resulted in better agreement with ICSD-56121 rather than with ICSD-28517 which assumes an initial structure model.

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