Robust parameter design for integrated circuit fabrication procedure with respect to categorical characteristic

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15 Citations (Scopus)

Abstract

We consider a robust parameter design of the process for forming contact windows in complementary metal-oxide semiconductor circuits. Robust design is often used to find the optimal levels of process conditions which would provide the output of consistent quality as close to a target value. In this paper, we analyze the results of the fractional factorial design of nine factors: mask dimension, viscosity, bake temperature, spin speed, bake time, aperture, exposure time, developing time, etch time, where the outcome of the experiment is measured in terms of a categorized window size with five categories. Random effect analysis is employed to model both the mean and variance of categorized window size as functions of some controllable factors as well as random errors. Empirical Bayes' procedures are then utilized to fit both the models, and to eventually find the robust design of CMOS circuit process by means of a Bootstrap resampling approach.

Original languageEnglish
Pages (from-to)253-260
Number of pages8
JournalReliability Engineering and System Safety
Volume66
Issue number3
DOIs
Publication statusPublished - 1999 Jan 1

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Integrated circuits
Fabrication
Random errors
Networks (circuits)
Masks
Viscosity
Metals
Experiments
Temperature

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Industrial and Manufacturing Engineering

Cite this

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abstract = "We consider a robust parameter design of the process for forming contact windows in complementary metal-oxide semiconductor circuits. Robust design is often used to find the optimal levels of process conditions which would provide the output of consistent quality as close to a target value. In this paper, we analyze the results of the fractional factorial design of nine factors: mask dimension, viscosity, bake temperature, spin speed, bake time, aperture, exposure time, developing time, etch time, where the outcome of the experiment is measured in terms of a categorized window size with five categories. Random effect analysis is employed to model both the mean and variance of categorized window size as functions of some controllable factors as well as random errors. Empirical Bayes' procedures are then utilized to fit both the models, and to eventually find the robust design of CMOS circuit process by means of a Bootstrap resampling approach.",
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