Scan cell reordering algorithm for low power consumption during scan-based testing

Wooheon Kang, Hyunyul Lim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Power consumption during scan-based testing can be higher than that of normal mode opeartions, which can cause yield loss and degradation of reliability. This paper proposes a scan cell reordering algorithm to reduce the test power consumption during scan-based testing. The proposed algorithm considers both shift-out operations and shift-in operations. A cumulative weighted transition (CWT) is proposed and compared to minimize the test power consumption. Experimental results show that the porposed method greatly reduces the average power during scan testing.

Original languageEnglish
Title of host publicationISOCC 2014 - International SoC Design Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages300-301
Number of pages2
ISBN (Electronic)9781479951260
DOIs
Publication statusPublished - 2015 Apr 16
Event11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of
Duration: 2014 Nov 32014 Nov 6

Publication series

NameISOCC 2014 - International SoC Design Conference

Other

Other11th International SoC Design Conference, ISOCC 2014
CountryKorea, Republic of
CityJeju
Period14/11/314/11/6

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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    Kang, W., Lim, H., & Kang, S. (2015). Scan cell reordering algorithm for low power consumption during scan-based testing. In ISOCC 2014 - International SoC Design Conference (pp. 300-301). [7087659] (ISOCC 2014 - International SoC Design Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2014.7087659