Scan cell reordering algorithm for low power consumption during scan-based testing

Wooheon Kang; Hyunyul Lim; Sungho Kang

doi:10.1109/ISOCC.2014.7087659

Scan cell reordering algorithm for low power consumption during scan-based testing

Wooheon Kang, Hyunyul Lim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Citations (Scopus)

Abstract

Power consumption during scan-based testing can be higher than that of normal mode opeartions, which can cause yield loss and degradation of reliability. This paper proposes a scan cell reordering algorithm to reduce the test power consumption during scan-based testing. The proposed algorithm considers both shift-out operations and shift-in operations. A cumulative weighted transition (CWT) is proposed and compared to minimize the test power consumption. Experimental results show that the porposed method greatly reduces the average power during scan testing.

Original language	English
Title of host publication	ISOCC 2014 - International SoC Design Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	300-301
Number of pages	2
ISBN (Electronic)	9781479951260
DOIs	https://doi.org/10.1109/ISOCC.2014.7087659
Publication status	Published - 2015 Apr 16
Event	11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of Duration: 2014 Nov 3 → 2014 Nov 6

Publication series

Name	ISOCC 2014 - International SoC Design Conference

Other

Other	11th International SoC Design Conference, ISOCC 2014
Country/Territory	Korea, Republic of
City	Jeju
Period	14/11/3 → 14/11/6

All Science Journal Classification (ASJC) codes

Hardware and Architecture

Access to Document

10.1109/ISOCC.2014.7087659

Cite this

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title = "Scan cell reordering algorithm for low power consumption during scan-based testing",

abstract = "Power consumption during scan-based testing can be higher than that of normal mode opeartions, which can cause yield loss and degradation of reliability. This paper proposes a scan cell reordering algorithm to reduce the test power consumption during scan-based testing. The proposed algorithm considers both shift-out operations and shift-in operations. A cumulative weighted transition (CWT) is proposed and compared to minimize the test power consumption. Experimental results show that the porposed method greatly reduces the average power during scan testing.",

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year = "2015",

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doi = "10.1109/ISOCC.2014.7087659",

language = "English",

series = "ISOCC 2014 - International SoC Design Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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note = "11th International SoC Design Conference, ISOCC 2014 ; Conference date: 03-11-2014 Through 06-11-2014",

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Kang, W, Lim, H & Kang, S 2015, Scan cell reordering algorithm for low power consumption during scan-based testing. in ISOCC 2014 - International SoC Design Conference., 7087659, ISOCC 2014 - International SoC Design Conference, Institute of Electrical and Electronics Engineers Inc., pp. 300-301, 11th International SoC Design Conference, ISOCC 2014, Jeju, Korea, Republic of, 14/11/3. https://doi.org/10.1109/ISOCC.2014.7087659

Scan cell reordering algorithm for low power consumption during scan-based testing. / Kang, Wooheon; Lim, Hyunyul; Kang, Sungho.

ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., 2015. p. 300-301 7087659 (ISOCC 2014 - International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - Scan cell reordering algorithm for low power consumption during scan-based testing

AU - Kang, Wooheon

AU - Lim, Hyunyul

AU - Kang, Sungho

PY - 2015/4/16

Y1 - 2015/4/16

N2 - Power consumption during scan-based testing can be higher than that of normal mode opeartions, which can cause yield loss and degradation of reliability. This paper proposes a scan cell reordering algorithm to reduce the test power consumption during scan-based testing. The proposed algorithm considers both shift-out operations and shift-in operations. A cumulative weighted transition (CWT) is proposed and compared to minimize the test power consumption. Experimental results show that the porposed method greatly reduces the average power during scan testing.

AB - Power consumption during scan-based testing can be higher than that of normal mode opeartions, which can cause yield loss and degradation of reliability. This paper proposes a scan cell reordering algorithm to reduce the test power consumption during scan-based testing. The proposed algorithm considers both shift-out operations and shift-in operations. A cumulative weighted transition (CWT) is proposed and compared to minimize the test power consumption. Experimental results show that the porposed method greatly reduces the average power during scan testing.

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M3 - Conference contribution

T3 - ISOCC 2014 - International SoC Design Conference

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BT - ISOCC 2014 - International SoC Design Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 11th International SoC Design Conference, ISOCC 2014

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Scan cell reordering algorithm for low power consumption during scan-based testing

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