Selective scan slice grouping technique for efficient test data compression

Yongjoon Kim, Jaeseok Park, Sungho Kang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.

Original languageEnglish
Pages (from-to)380-383
Number of pages4
JournalIEICE Transactions on Information and Systems
VolumeE93-D
Issue number2
DOIs
Publication statusPublished - 2010 Jan 1

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Data compression
Networks (circuits)
Experiments

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

Cite this

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Selective scan slice grouping technique for efficient test data compression. / Kim, Yongjoon; Park, Jaeseok; Kang, Sungho.

In: IEICE Transactions on Information and Systems, Vol. E93-D, No. 2, 01.01.2010, p. 380-383.

Research output: Contribution to journalArticle

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