In this paper, we present a selective scan slice encoding technique for power-aware test data compression. The proposed scheme dramatically reduces test data volume via scan slice repetition, and generates an adjacent-filled test pattern known as the favorable lowpower pattern mapping method. Experiments were performed on the large ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering