Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume

Yongjoon Kim, Jaeseok Park, Sungho Kang

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

In this paper, we present a selective scan slice encoding technique for power-aware test data compression. The proposed scheme dramatically reduces test data volume via scan slice repetition, and generates an adjacent-filled test pattern known as the favorable lowpower pattern mapping method. Experiments were performed on the large ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.

Original languageEnglish
Pages (from-to)1432-1437
Number of pages6
JournalIEICE Electronics Express
Volume6
Issue number20
DOIs
Publication statusPublished - 2009 Oct 25

Fingerprint

Data compression
repetition
Electric power utilization
Networks (circuits)
data compression
Experiments
coding

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume. / Kim, Yongjoon; Park, Jaeseok; Kang, Sungho.

In: IEICE Electronics Express, Vol. 6, No. 20, 25.10.2009, p. 1432-1437.

Research output: Contribution to journalArticle

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