Self-optimized coverage coordination in femtocell networks

Han Shin Jo, Cheol Mun, June Moon, Jong Gwan Yook

Research output: Contribution to journalArticlepeer-review

97 Citations (Scopus)

Abstract

This paper proposes a self-optimized coverage coordination scheme for two-tier femtocell networks, in which a femtocell base station adjusts the transmit power based on the statistics of the signal and the interference power that is measured at a femtocell downlink. Furthermore, an analytic expression is derived for the coverage leakage probability that a femtocell coverage area leaks into an outdoor macrocell. The coverage analysis is verified by simulation, which shows that the proposed scheme provides sufficient indoor femtocell coverage and that the femtocell coverage does not leak into an outdoor macrocell.

Original languageEnglish
Article number5581208
Pages (from-to)2977-2982
Number of pages6
JournalIEEE Transactions on Wireless Communications
Volume9
Issue number10
DOIs
Publication statusPublished - 2010 Oct

Bibliographical note

Funding Information:
Manuscript received October 2, 2008; revised August 6, 2009 and June 9, 2010; accepted August 14, 2010. The associate editor coordinating the review of this letter and approving it for publication was D. Zeghlache. H.-S. Jo is with the Wireless Networking and Communications Group, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX78712-0240 USA (e-mail: han-shin.jo@austin.utexas.edu). C. Mun is with the Dept. of Electronic Communication Eng., Chungju National University, Chungju, Korea (e-mail: chmun@cjnu.ac.kr). J. Moon is with the Telecommunication R&D Center, Samsung Electronics, Suwon, Gyeonggi, Korea 442-742 (e-mail: june.moon@samsung.com). J.-G. Yook is with the Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea 120-149 (e-mail: jgyook@yonsei.ac.kr). This work was supported in part by Samsung Electronics and National Research Foundation of Korea Grant funded by the Korean Government (KRF-2008-2-D00660). Digital Object Identifier 10.1109/TWC.2010.090210.081313

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

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