Self-triggered SCR in output driver for enhanced ESD robustness

Taeg Hyun Kang, Jun Hyeong Ryu, Moon Ho Kim, Eui-Young Chung, Donna Robinson-Hahn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents an enhanced ESD (Electrostatic Discharge) protection solution for output drivers without additional protection devices. The output drivers in low and high voltage CMOS technologies are often susceptible against the ESD stresses with and without the ESD protection devices. The proposed structure shows significantly improved ESD immunity using a consolidated NPBL (N Plus Buried Layer) mask underneath an ESD protection SCR (Silicon Controlled Rectifier) for the VCC to the ground and the output drivers, which are effectively triggered when ESD events occur. This consolidated NPBL plays an important role of a booster for faster triggering than other parasitic devices.

Original languageEnglish
Title of host publicationISPSD '08, Proceedings of the 20th International Symposium on Power Semiconductor Devices and IC's
Pages201-204
Number of pages4
DOIs
Publication statusPublished - 2008 Sep 17
EventISPSD '08, 20th International Symposium on Power Semiconductor Devices and IC's - Orlando, FL, United States
Duration: 2008 May 182008 May 22

Other

OtherISPSD '08, 20th International Symposium on Power Semiconductor Devices and IC's
CountryUnited States
CityOrlando, FL
Period08/5/1808/5/22

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All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Kang, T. H., Ryu, J. H., Kim, M. H., Chung, E-Y., & Robinson-Hahn, D. (2008). Self-triggered SCR in output driver for enhanced ESD robustness. In ISPSD '08, Proceedings of the 20th International Symposium on Power Semiconductor Devices and IC's (pp. 201-204). [4538933] https://doi.org/10.1109/ISPSD.2008.4538933