We report on the fabrication of ZnO-based ultraviolet (UV)-detecting thin-film transistors (TFTs) with a semitransparent conducting NiOx top-gate electrode window and 450 nm-thick poly-4-vinylphenol (PVP) gate dielectric layer that has been formed on n-ZnO by spin-casting. The field effect electron mobility of our device was only about 0.0032 cm2/Vs at the saturation regime of gate bias showing a low saturation current level in the dark because the PVP dielectric has a relatively low dielectric capacitance (7.4 nF/cm2). The on/off current ratio of the device was about 103. However, the current increased up by more than 30 times with UV illumination of 325 nm wavelength (power density ∼50 μW/cm2) while the initial current level was not varied with visible green illumination. We conclude that our ZnO-TFT with organic gate dielectric can be a promising transparent UV-detecting device. copyright The Electrochemical Society.
|Number of pages||11|
|Publication status||Published - 2006 Dec 1|
|Event||Student Posters (General) - 208th Electrochemical Society Meeting - Los Angeles, CA, United States|
Duration: 2005 Oct 16 → 2005 Oct 21
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