Simple chromatic dispersion measurement method using a spectral interferometer

J. Y. Lee, I. H. Shin, S. R. Lee, Tau Wei, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


We present a novel chromatic dispersion measurement method using a spectral domain interferometer for single mode optical fiber over a wide spectral range (200 nm). This technique is based on the Mach-Zehnder interferometer using a white light source and spectrometer. A phase was directly retrieved from a measured spectral interferogram to obtain relative group velocity, chromatic dispersion and dispersion slope. The measured results with the proposed method were compared with those obtained using a conventional measurement method. Those results have good agreement with each other. Our proposed method can simply, accurately, and quickly (< 500 ms) measure chromatic information for a short length of optical fiber as well as optical devices.

Original languageEnglish
Title of host publicationOptical Components and Materials IV
Publication statusPublished - 2007 May 23
EventOptical Components and Materials IV - San Jose, CA, United States
Duration: 2007 Jan 222007 Jan 24


OtherOptical Components and Materials IV
CountryUnited States
CitySan Jose, CA


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Lee, J. Y., Shin, I. H., Lee, S. R., Wei, T., & Kim, D. Y. (2007). Simple chromatic dispersion measurement method using a spectral interferometer. In Optical Components and Materials IV (Vol. 6469). [646911]