Simple method to enhance positive bias stress stability of In-Ga-Zn-O thin-film transistors using a vertically graded oxygen-vacancy active layer

Ji Hoon Park, Yeong Gyu Kim, Seokhyun Yoon, Seonghwan Hong, Hyun Jae Kim

Research output: Contribution to journalArticle

27 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science