Simultaneous reduction of copper and toxicity in semiconductor wastewater using protonated alginate beads

Sunghwan Bang, Jae Woo Choi, Kangwoo Cho, Chongmin Chung, Hojeong Kang, Seok Won Hong

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Using protonated alginate (HA) beads, copper (Cu2+) levels and toxicity were concurrently reduced in semiconductor wastewater produced from the chemical mechanical planarization process. The beneficial effect of protonation could be explained by a reduction in the release of Ca2+, which is a competitive cation during sorption of Cu2+, leading to an increased in the sorption capacity from 107 to 189 mg/g. Monitoring of the acute toxicity of two different types of semiconductor wastewater toward Daphnia magna suggested that Cu2+ was the cause of toxicity. The toxicity identification evaluation using D. magna indicated that Cu2+ was a major toxicant in the raw wastewater with concentrations of 1.97 and 3.37 mg/L for two different raw wastewater samples with initial toxicities of 14.2 and 23.6 toxic unit (TU), respectively. This relationship was verified by the correlation coefficients between Cu2+ concentration and acute toxicity (r2 = 0.829 at P < 0.05 and 0.894 at P < 0.05 for two types of semiconductor wastewater) in mass balance tests. The laboratory continuous column test using HA beads showed that the Cu2+ concentration in effluent was proportional to the acute toxicity. In particular, the TU values increased sharply when the residual concentration of Cu2+ exceeded 0.1 mg/L. The test battery results indicated that D. magna was more sensitive than other aquatic species, i.e., algae and bacteria, to Cu2+ in semiconductor wastewater.

Original languageEnglish
Pages (from-to)525-531
Number of pages7
JournalChemical Engineering Journal
Volume288
DOIs
Publication statusPublished - 2016 Mar 15

Fingerprint

alginate
Alginate
Toxicity
Copper
Wastewater
Semiconductor materials
copper
toxicity
wastewater
Poisons
Sorption
sorption
Chemical mechanical polishing
Protonation
Algae
alginic acid
semiconductor
Cations
Effluents
mass balance

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Environmental Chemistry
  • Chemical Engineering(all)
  • Industrial and Manufacturing Engineering

Cite this

Bang, Sunghwan ; Choi, Jae Woo ; Cho, Kangwoo ; Chung, Chongmin ; Kang, Hojeong ; Hong, Seok Won. / Simultaneous reduction of copper and toxicity in semiconductor wastewater using protonated alginate beads. In: Chemical Engineering Journal. 2016 ; Vol. 288. pp. 525-531.
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Simultaneous reduction of copper and toxicity in semiconductor wastewater using protonated alginate beads. / Bang, Sunghwan; Choi, Jae Woo; Cho, Kangwoo; Chung, Chongmin; Kang, Hojeong; Hong, Seok Won.

In: Chemical Engineering Journal, Vol. 288, 15.03.2016, p. 525-531.

Research output: Contribution to journalArticle

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AU - Hong, Seok Won

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