Simultaneous static testing of A/D and D/A converters using a built-in structure

Incheol Kim, Jaewon Jang, Hyeon Uk Son, Jaeseok Park, Sungho Kang

Research output: Contribution to journalArticle

Abstract

Static testing of analog-to-digital (A/D) and digital-to-analog (D/A) converters becomes more difficult when they are embedded in a system on chip. Built-in self-test (BIST) reduces the need for external support for testing. This paper proposes a new static BIST structure for testing both A/D and D/A converters. By sharing test circuitry, the proposed BIST reduces the hardware overhead. Furthermore, test time can also be reduced using the simultaneous test strategy of the proposed BIST. The proposed method can be applied in various A/D and D/A converter resolutions and analog signal swing ranges. Simulation results are presented to validate the proposed method by showing how linearity errors are detected in different situations.

Original languageEnglish
Pages (from-to)109-119
Number of pages11
JournalETRI Journal
Volume35
Issue number1
DOIs
Publication statusPublished - 2013 Feb 1

Fingerprint

Built-in self test
Digital to analog conversion
Testing
Hardware

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Electrical and Electronic Engineering

Cite this

Kim, Incheol ; Jang, Jaewon ; Son, Hyeon Uk ; Park, Jaeseok ; Kang, Sungho. / Simultaneous static testing of A/D and D/A converters using a built-in structure. In: ETRI Journal. 2013 ; Vol. 35, No. 1. pp. 109-119.
@article{900c8e2348fb4205b6f62f702d1c4261,
title = "Simultaneous static testing of A/D and D/A converters using a built-in structure",
abstract = "Static testing of analog-to-digital (A/D) and digital-to-analog (D/A) converters becomes more difficult when they are embedded in a system on chip. Built-in self-test (BIST) reduces the need for external support for testing. This paper proposes a new static BIST structure for testing both A/D and D/A converters. By sharing test circuitry, the proposed BIST reduces the hardware overhead. Furthermore, test time can also be reduced using the simultaneous test strategy of the proposed BIST. The proposed method can be applied in various A/D and D/A converter resolutions and analog signal swing ranges. Simulation results are presented to validate the proposed method by showing how linearity errors are detected in different situations.",
author = "Incheol Kim and Jaewon Jang and Son, {Hyeon Uk} and Jaeseok Park and Sungho Kang",
year = "2013",
month = "2",
day = "1",
doi = "10.4218/etrij.13.0112.0198",
language = "English",
volume = "35",
pages = "109--119",
journal = "ETRI Journal",
issn = "1225-6463",
publisher = "ETRI",
number = "1",

}

Simultaneous static testing of A/D and D/A converters using a built-in structure. / Kim, Incheol; Jang, Jaewon; Son, Hyeon Uk; Park, Jaeseok; Kang, Sungho.

In: ETRI Journal, Vol. 35, No. 1, 01.02.2013, p. 109-119.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Simultaneous static testing of A/D and D/A converters using a built-in structure

AU - Kim, Incheol

AU - Jang, Jaewon

AU - Son, Hyeon Uk

AU - Park, Jaeseok

AU - Kang, Sungho

PY - 2013/2/1

Y1 - 2013/2/1

N2 - Static testing of analog-to-digital (A/D) and digital-to-analog (D/A) converters becomes more difficult when they are embedded in a system on chip. Built-in self-test (BIST) reduces the need for external support for testing. This paper proposes a new static BIST structure for testing both A/D and D/A converters. By sharing test circuitry, the proposed BIST reduces the hardware overhead. Furthermore, test time can also be reduced using the simultaneous test strategy of the proposed BIST. The proposed method can be applied in various A/D and D/A converter resolutions and analog signal swing ranges. Simulation results are presented to validate the proposed method by showing how linearity errors are detected in different situations.

AB - Static testing of analog-to-digital (A/D) and digital-to-analog (D/A) converters becomes more difficult when they are embedded in a system on chip. Built-in self-test (BIST) reduces the need for external support for testing. This paper proposes a new static BIST structure for testing both A/D and D/A converters. By sharing test circuitry, the proposed BIST reduces the hardware overhead. Furthermore, test time can also be reduced using the simultaneous test strategy of the proposed BIST. The proposed method can be applied in various A/D and D/A converter resolutions and analog signal swing ranges. Simulation results are presented to validate the proposed method by showing how linearity errors are detected in different situations.

UR - http://www.scopus.com/inward/record.url?scp=84873641820&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84873641820&partnerID=8YFLogxK

U2 - 10.4218/etrij.13.0112.0198

DO - 10.4218/etrij.13.0112.0198

M3 - Article

VL - 35

SP - 109

EP - 119

JO - ETRI Journal

JF - ETRI Journal

SN - 1225-6463

IS - 1

ER -