TY - GEN
T1 - Size resolution with Light Induced Dielectrophoresis (LIDEP)
AU - Neale, Steven L.
AU - Mazilu, Michael
AU - MacDonald, Michael P.
AU - Wilson, John I.B.
AU - Dholakia, Kishan
AU - Krauss, Thomas F.
N1 - Copyright:
Copyright 2011 Elsevier B.V., All rights reserved.
PY - 2006
Y1 - 2006
N2 - We present a study into the small particle size and resolution limits of Light Induced Dielectrophoresis (LIDEP). Here the illumination of a photoconductive layer creates virtual electrodes whose associated electric field gradients cause the dielectrophoretic response of the particles. In this way a potential energy landscape can be created that is optically controlled giving reconfigurable control over a large area [1]. In this paper we discuss the interlinked limits of size of particle it is possible to manipulate and the resolution these particles can be manipulated with. We compare traditional dielectrophoresis (DEP) experiments with LIDEP experiments, and discuss the mechanisms behind the physical limits comparing the effects of carrier diffusion verses the spreading of the electric fields in the medium.
AB - We present a study into the small particle size and resolution limits of Light Induced Dielectrophoresis (LIDEP). Here the illumination of a photoconductive layer creates virtual electrodes whose associated electric field gradients cause the dielectrophoretic response of the particles. In this way a potential energy landscape can be created that is optically controlled giving reconfigurable control over a large area [1]. In this paper we discuss the interlinked limits of size of particle it is possible to manipulate and the resolution these particles can be manipulated with. We compare traditional dielectrophoresis (DEP) experiments with LIDEP experiments, and discuss the mechanisms behind the physical limits comparing the effects of carrier diffusion verses the spreading of the electric fields in the medium.
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U2 - 10.1117/12.679440
DO - 10.1117/12.679440
M3 - Conference contribution
AN - SCOPUS:33751406128
SN - 0819464058
SN - 9780819464057
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Trapping and Optical Micromanipulation III
T2 - Optical Trapping and Optical Micromanipulation III
Y2 - 13 August 2006 through 17 August 2006
ER -