Size resolution with Light Induced Dielectrophoresis (LIDEP)

Steven L. Neale, Michael Mazilu, Michael P. MacDonald, John I.B. Wilson, Kishan Dholakia, Thomas F. Krauss

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

We present a study into the small particle size and resolution limits of Light Induced Dielectrophoresis (LIDEP). Here the illumination of a photoconductive layer creates virtual electrodes whose associated electric field gradients cause the dielectrophoretic response of the particles. In this way a potential energy landscape can be created that is optically controlled giving reconfigurable control over a large area [1]. In this paper we discuss the interlinked limits of size of particle it is possible to manipulate and the resolution these particles can be manipulated with. We compare traditional dielectrophoresis (DEP) experiments with LIDEP experiments, and discuss the mechanisms behind the physical limits comparing the effects of carrier diffusion verses the spreading of the electric fields in the medium.

Original languageEnglish
Title of host publicationOptical Trapping and Optical Micromanipulation III
DOIs
Publication statusPublished - 2006 Dec 1
EventOptical Trapping and Optical Micromanipulation III - San Diego, CA, United States
Duration: 2006 Aug 132006 Aug 17

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6326
ISSN (Print)0277-786X

Conference

ConferenceOptical Trapping and Optical Micromanipulation III
CountryUnited States
CitySan Diego, CA
Period06/8/1306/8/17

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Neale, S. L., Mazilu, M., MacDonald, M. P., Wilson, J. I. B., Dholakia, K., & Krauss, T. F. (2006). Size resolution with Light Induced Dielectrophoresis (LIDEP). In Optical Trapping and Optical Micromanipulation III [632618] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6326). https://doi.org/10.1117/12.679440