Sliding and rolling frictional behavior of a single ZnO nanowire during manipulation with an AFM

Hyun Joon Kim, Kyeong Hee Kang, Dae Eun Kim

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

The frictional behavior during manipulation of a single ZnO nanowire with a mass of about 18.7 ng placed horizontally on a Si wafer was examined using atomic force microscopy (AFM). The frictional force measured was in the range of 36.4 nN to 69.3 nN, which corresponded to extremely high friction coefficients of 242 and 462, respectively. However, when the adhesion force of the nanowire was considered, the friction coefficients were similar to the values typically encountered in macro-scale systems. During manipulation of the nanowire, both rolling and sliding motions were observed depending on the nanowire-Si frictional interaction. Unlike macro-scale systems, the difference between the frictional forces of rolling/sliding and pure sliding motions of the nanowire was not drastic.

Original languageEnglish
Pages (from-to)6081-6087
Number of pages7
JournalNanoscale
Volume5
Issue number13
DOIs
Publication statusPublished - 2013 Jul 5

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Nanowires
Atomic force microscopy
Macros
Friction
Adhesion

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

Cite this

Kim, Hyun Joon ; Kang, Kyeong Hee ; Kim, Dae Eun. / Sliding and rolling frictional behavior of a single ZnO nanowire during manipulation with an AFM. In: Nanoscale. 2013 ; Vol. 5, No. 13. pp. 6081-6087.
@article{31b0129b2e894e919c5cc134e483e0c4,
title = "Sliding and rolling frictional behavior of a single ZnO nanowire during manipulation with an AFM",
abstract = "The frictional behavior during manipulation of a single ZnO nanowire with a mass of about 18.7 ng placed horizontally on a Si wafer was examined using atomic force microscopy (AFM). The frictional force measured was in the range of 36.4 nN to 69.3 nN, which corresponded to extremely high friction coefficients of 242 and 462, respectively. However, when the adhesion force of the nanowire was considered, the friction coefficients were similar to the values typically encountered in macro-scale systems. During manipulation of the nanowire, both rolling and sliding motions were observed depending on the nanowire-Si frictional interaction. Unlike macro-scale systems, the difference between the frictional forces of rolling/sliding and pure sliding motions of the nanowire was not drastic.",
author = "Kim, {Hyun Joon} and Kang, {Kyeong Hee} and Kim, {Dae Eun}",
year = "2013",
month = "7",
day = "5",
doi = "10.1039/c3nr34029e",
language = "English",
volume = "5",
pages = "6081--6087",
journal = "Nanoscale",
issn = "2040-3364",
publisher = "Royal Society of Chemistry",
number = "13",

}

Sliding and rolling frictional behavior of a single ZnO nanowire during manipulation with an AFM. / Kim, Hyun Joon; Kang, Kyeong Hee; Kim, Dae Eun.

In: Nanoscale, Vol. 5, No. 13, 05.07.2013, p. 6081-6087.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Sliding and rolling frictional behavior of a single ZnO nanowire during manipulation with an AFM

AU - Kim, Hyun Joon

AU - Kang, Kyeong Hee

AU - Kim, Dae Eun

PY - 2013/7/5

Y1 - 2013/7/5

N2 - The frictional behavior during manipulation of a single ZnO nanowire with a mass of about 18.7 ng placed horizontally on a Si wafer was examined using atomic force microscopy (AFM). The frictional force measured was in the range of 36.4 nN to 69.3 nN, which corresponded to extremely high friction coefficients of 242 and 462, respectively. However, when the adhesion force of the nanowire was considered, the friction coefficients were similar to the values typically encountered in macro-scale systems. During manipulation of the nanowire, both rolling and sliding motions were observed depending on the nanowire-Si frictional interaction. Unlike macro-scale systems, the difference between the frictional forces of rolling/sliding and pure sliding motions of the nanowire was not drastic.

AB - The frictional behavior during manipulation of a single ZnO nanowire with a mass of about 18.7 ng placed horizontally on a Si wafer was examined using atomic force microscopy (AFM). The frictional force measured was in the range of 36.4 nN to 69.3 nN, which corresponded to extremely high friction coefficients of 242 and 462, respectively. However, when the adhesion force of the nanowire was considered, the friction coefficients were similar to the values typically encountered in macro-scale systems. During manipulation of the nanowire, both rolling and sliding motions were observed depending on the nanowire-Si frictional interaction. Unlike macro-scale systems, the difference between the frictional forces of rolling/sliding and pure sliding motions of the nanowire was not drastic.

UR - http://www.scopus.com/inward/record.url?scp=84883258663&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84883258663&partnerID=8YFLogxK

U2 - 10.1039/c3nr34029e

DO - 10.1039/c3nr34029e

M3 - Article

VL - 5

SP - 6081

EP - 6087

JO - Nanoscale

JF - Nanoscale

SN - 2040-3364

IS - 13

ER -