TY - GEN
T1 - Software-based embedded core test using multi-polynomial for test data reduction
AU - Kang, Soyeon
AU - Choi, Inhyuk
AU - Lim, Hyeonchan
AU - Seo, Sungyoul
AU - Kang, Sungho
N1 - Publisher Copyright:
© 2016 IEEE.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2016/12/27
Y1 - 2016/12/27
N2 - Software-based self-Test (SBST) is a self-Test where processors and intellectual property (IP) cores test itself using an embedded memory. However, an environment-limited memory size is one of the biggest challenges. In this paper, we present a new SBST solution using multiple polynomials. For reducing the required test data, the polynomials consist of a primitive polynomial and (BM)-Algorithm based polynomials and each polynomial generates pseudo random patterns and deterministic patterns respectively. Experimental results show that this SBST method reduces the size of the test program without a reduction of the fault coverage.
AB - Software-based self-Test (SBST) is a self-Test where processors and intellectual property (IP) cores test itself using an embedded memory. However, an environment-limited memory size is one of the biggest challenges. In this paper, we present a new SBST solution using multiple polynomials. For reducing the required test data, the polynomials consist of a primitive polynomial and (BM)-Algorithm based polynomials and each polynomial generates pseudo random patterns and deterministic patterns respectively. Experimental results show that this SBST method reduces the size of the test program without a reduction of the fault coverage.
UR - http://www.scopus.com/inward/record.url?scp=85010377940&partnerID=8YFLogxK
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U2 - 10.1109/ISOCC.2016.7799762
DO - 10.1109/ISOCC.2016.7799762
M3 - Conference contribution
AN - SCOPUS:85010377940
T3 - ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things
SP - 39
EP - 40
BT - ISOCC 2016 - International SoC Design Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th International SoC Design Conference, ISOCC 2016
Y2 - 23 October 2016 through 26 October 2016
ER -