Special issue on advanced biometrics with deep learning

Andrew Beng Jin Teoh; Lu Leng

doi:10.3390/app10134453

Special issue on advanced biometrics with deep learning

Andrew Beng Jin Teoh, Lu Leng

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Editorial › peer-review

4 Citations (Scopus)

Original language	English
Article number	4453
Journal	Applied Sciences (Switzerland)
Volume	10
Issue number	13
DOIs	https://doi.org/10.3390/app10134453
Publication status	Published - 2020 Jul 1

Bibliographical note

Funding Information:
Funding: This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (NO. NRF-2019R1A2C1003306) and National Natural Science Foundation of China (61866028).

All Science Journal Classification (ASJC) codes

Materials Science(all)
Instrumentation
Engineering(all)
Process Chemistry and Technology
Computer Science Applications
Fluid Flow and Transfer Processes

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10.3390/app10134453

Cite this

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title = "Special issue on advanced biometrics with deep learning",

author = "Teoh, {Andrew Beng Jin} and Lu Leng",

note = "Funding Information: Funding: This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (NO. NRF-2019R1A2C1003306) and National Natural Science Foundation of China (61866028).",

year = "2020",

month = jul,

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doi = "10.3390/app10134453",

language = "English",

volume = "10",

journal = "Applied Sciences (Switzerland)",

issn = "2076-3417",

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number = "13",

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T1 - Special issue on advanced biometrics with deep learning

AU - Teoh, Andrew Beng Jin

AU - Leng, Lu

N1 - Funding Information: Funding: This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (NO. NRF-2019R1A2C1003306) and National Natural Science Foundation of China (61866028).

PY - 2020/7/1

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U2 - 10.3390/app10134453

DO - 10.3390/app10134453

M3 - Editorial

AN - SCOPUS:85087856942

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VL - 10

JO - Applied Sciences (Switzerland)

JF - Applied Sciences (Switzerland)

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ER -

Special issue on advanced biometrics with deep learning

Bibliographical note

All Science Journal Classification (ASJC) codes

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