SRAM transparent testing methodology using dynamic power supply current

H. S. Kim, D. H. Yoon, Sungho Kang

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

A new transparent testing methodology using dynamic power supply current is proposed which is much simpler than traditional transparent testing algorithms. It employs the dynamic power supply current instead of making signatures so that it does not need the extra steps and hardware to generate a signature. The paper describes how to convert a March algorithm to a transparent one and how to cover the fault models considered. The transformed algorithm is much simpler and test time can be greatly reduced. In addition, it can detect extra faults that the original algorithm cannot. The whole BIST architecture is described, together with a new peak current detector.

Original languageEnglish
Pages (from-to)217-222
Number of pages6
JournalIEE Proceedings: Circuits, Devices and Systems
Volume148
Issue number4
DOIs
Publication statusPublished - 2001 Aug 1

Fingerprint

Static random access storage
Testing
Built-in self test
Detectors
Hardware

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

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SRAM transparent testing methodology using dynamic power supply current. / Kim, H. S.; Yoon, D. H.; Kang, Sungho.

In: IEE Proceedings: Circuits, Devices and Systems, Vol. 148, No. 4, 01.08.2001, p. 217-222.

Research output: Contribution to journalArticle

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