Stable system technique for measuring the refractive index profile of an optical fiber by modified fiber-type confocal microscope method

Bum Cho Seung, Youk Youngchun, Young Kim Dug

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Using a fiber-type confocal scanning optical microscope system, we have obtained a stable refractive index profile measurement system of good performance. We could acquire excellent index precision and good spatial resolution by using a fiber-optic system for the majority part instead of a bulk-optic system and a single mode fiber at visible region with a 4 μm core diameter instead of a pinhole structure. Also, using a power detection system that is synchronous with fiber-coupled detector, we have improved system stability by reducing noise generated by the roughness of a sample surface because of using the optical fiber as a pinhole system. The light reflected by the sample surface was divided by a beam splitter; one ray passed back through the optical fiber in order to detect a confocal point and another ray entered the synchronous power detector in order to detect reflected power. The power detected by the synchronous power detector without a pinhole is less sensitive to the surface roughness than the power detected by the fiber-coupled detector. We could implement the simple and robust index measurement system by using a fiber-optic system and a synchronous detection system, and a single mode fiber was measured to demonstrate the effectiveness of our proposed measurement system.

Original languageEnglish
Title of host publicationOptical Components and Materials IV
DOIs
Publication statusPublished - 2007
EventOptical Components and Materials IV - San Jose, CA, United States
Duration: 2007 Jan 222007 Jan 24

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6469
ISSN (Print)0277-786X

Other

OtherOptical Components and Materials IV
Country/TerritoryUnited States
CitySan Jose, CA
Period07/1/2207/1/24

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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