Stain defect detection for mobile phone camera modules

Sehee Hong, Chulhee Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this paper, we present a stain defect detection algorithm based on the difference of window mean brightness. In particular, we use the maximum square value of the difference brightness in divided windows (MAXWDMS). Window shapes generally affect WDMS values and make stain images clearly distinguishable. The proposed method consists of three steps: window design, stain localization using MAXWDMS and setting the WDMS level. The proposed methodology has been successfully used in stain defect detection, achieving good detection rates in both quantitative evaluation and sensibility estimation. Experimental results show improved detection accuracy and a satisfactory processing time.

Original languageEnglish
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Image Processing
Subtitle of host publicationMachine Vision Applications VII
PublisherSPIE
ISBN (Print)9780819499417
DOIs
Publication statusPublished - 2014
EventImage Processing: Machine Vision Applications VII - San Francisco, CA, United States
Duration: 2014 Feb 32014 Feb 4

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9024
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherImage Processing: Machine Vision Applications VII
CountryUnited States
CitySan Francisco, CA
Period14/2/314/2/4

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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