Statistical analysis of embedded capacitors using Monte Carlo simulation

Lawrence Carastro; Ilgu Yun; Ravi Poddar; Martin Brooke; Gary S. May

Statistical analysis of embedded capacitors using Monte Carlo simulation

Lawrence Carastro, Ilgu Yun, Ravi Poddar, Martin Brooke, Gary S. May

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Conference article › peer-review

4 Citations (Scopus)

Abstract

A method of accurately modeling new passive devices by deembedding the many building blocks is described. It is shown that the variation in the complete equivalent circuit models can be used to predict variations in actual fabricated devices.

Original language	English
Pages (from-to)	198-205
Number of pages	8
Journal	Proceedings - Electronic Components and Technology Conference
Publication status	Published - 2000

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

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title = "Statistical analysis of embedded capacitors using Monte Carlo simulation",

abstract = "A method of accurately modeling new passive devices by deembedding the many building blocks is described. It is shown that the variation in the complete equivalent circuit models can be used to predict variations in actual fabricated devices.",

author = "Lawrence Carastro and Ilgu Yun and Ravi Poddar and Martin Brooke and May, {Gary S.}",

year = "2000",

language = "English",

pages = "198--205",

journal = "Proceedings - Electronic Components and Technology Conference",

issn = "0569-5503",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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TY - JOUR

T1 - Statistical analysis of embedded capacitors using Monte Carlo simulation

AU - Carastro, Lawrence

AU - Yun, Ilgu

AU - Poddar, Ravi

AU - Brooke, Martin

AU - May, Gary S.

PY - 2000

Y1 - 2000

N2 - A method of accurately modeling new passive devices by deembedding the many building blocks is described. It is shown that the variation in the complete equivalent circuit models can be used to predict variations in actual fabricated devices.

AB - A method of accurately modeling new passive devices by deembedding the many building blocks is described. It is shown that the variation in the complete equivalent circuit models can be used to predict variations in actual fabricated devices.

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M3 - Conference article

AN - SCOPUS:0034476248

SN - 0569-5503

SP - 198

EP - 205

JO - Proceedings - Electronic Components and Technology Conference

JF - Proceedings - Electronic Components and Technology Conference

ER -

Statistical analysis of embedded capacitors using Monte Carlo simulation

Abstract

All Science Journal Classification (ASJC) codes

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