Statistical analysis of embedded capacitors using Monte Carlo simulation

Lawrence Carastro, Ilgu Yun, Ravi Poddar, Martin Brooke, Gary S. May

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)


A method of accurately modeling new passive devices by deembedding the many building blocks is described. It is shown that the variation in the complete equivalent circuit models can be used to predict variations in actual fabricated devices.

Original languageEnglish
Pages (from-to)198-205
Number of pages8
JournalProceedings - Electronic Components and Technology Conference
Publication statusPublished - 2000

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


Dive into the research topics of 'Statistical analysis of embedded capacitors using Monte Carlo simulation'. Together they form a unique fingerprint.

Cite this