Stochastic turning point problem in a one-dimensional refractive random multilayer

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A one-dimensional model of random scattering is considered for a totally refracting random multilayer that has two separated spatial scales, i.e., deterministic macroscale and random microscale. The interplay of internal refraction and random multiple scattering for a turning point problem is analyzed with an intermediate scale of the wavelength. Two extended limit theorems for stochastic differential equations with a small parameter provide the characterization of the diffusion processes above and below the turning point. Both results are combined, and a global limit law for the phenomenon of the random phase is obtained.

Original languageEnglish
Pages (from-to)1164-1180
Number of pages17
JournalSIAM Journal on Applied Mathematics
Volume56
Issue number4
DOIs
Publication statusPublished - 1996 Jan 1

Fingerprint

Turning Point
Multilayer
Multilayers
Multiple scattering
Refraction
Differential equations
Scattering
Wavelength
Limit Laws
Multiple Scattering
One-dimensional Model
Limit Theorems
Small Parameter
Diffusion Process
Stochastic Equations
Differential equation
Internal

All Science Journal Classification (ASJC) codes

  • Applied Mathematics

Cite this

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Stochastic turning point problem in a one-dimensional refractive random multilayer. / Kim, Jeong Hoon.

In: SIAM Journal on Applied Mathematics, Vol. 56, No. 4, 01.01.1996, p. 1164-1180.

Research output: Contribution to journalArticle

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