TY - JOUR
T1 - Stochastic turning point problem in a one-dimensional refractive random multilayer
AU - Kim, Jeong Hoon
PY - 1996/8
Y1 - 1996/8
N2 - A one-dimensional model of random scattering is considered for a totally refracting random multilayer that has two separated spatial scales, i.e., deterministic macroscale and random microscale. The interplay of internal refraction and random multiple scattering for a turning point problem is analyzed with an intermediate scale of the wavelength. Two extended limit theorems for stochastic differential equations with a small parameter provide the characterization of the diffusion processes above and below the turning point. Both results are combined, and a global limit law for the phenomenon of the random phase is obtained.
AB - A one-dimensional model of random scattering is considered for a totally refracting random multilayer that has two separated spatial scales, i.e., deterministic macroscale and random microscale. The interplay of internal refraction and random multiple scattering for a turning point problem is analyzed with an intermediate scale of the wavelength. Two extended limit theorems for stochastic differential equations with a small parameter provide the characterization of the diffusion processes above and below the turning point. Both results are combined, and a global limit law for the phenomenon of the random phase is obtained.
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U2 - 10.1137/S0036139994277816
DO - 10.1137/S0036139994277816
M3 - Article
AN - SCOPUS:0030214649
SN - 0036-1399
VL - 56
SP - 1164
EP - 1180
JO - SIAM Journal on Applied Mathematics
JF - SIAM Journal on Applied Mathematics
IS - 4
ER -