Stray light analysis of SALEX instrument

Sun Jeong Ham, Hanshin Lee, Jae Min Lee, Sug Whan Kim, Tony Richards, Mike Lockwood

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Discrepancies between recent global earth albedo anomaly data obtained from the climate models, space and ground observations call for a new and better earth reflectance measurement technique. The SALEX (Space Ashen Light Explorer) instrument is a space-based visible and IR instrument for precise estimation of the global earth albedo by measuring the ashen light reflected off the shadowy side of the Moon from the low earth orbit. The instrument consists of a conventional 2-mirror telescope, a pair of a 3-mirror visible imager and an IR bolometer. The performance of this unique multi-channel optical system is sensitive to the stray light contamination due to the complex optical train incorporating several reflecting and refracting elements, associated mounts and the payload mechanical enclosure. This could be further aggravated by the very bright and extended observation target (i.e. the Moon). In this paper, we report the details of extensive stray light analysis including ghosts and cross-talks, leading to the optimum set of stray light precautions for the highest signal-to-noise ratio attainable.

Original languageEnglish
Title of host publicationOptical System Contamination
Subtitle of host publicationEffects, Measurements, and Control 2008
DOIs
Publication statusPublished - 2008
EventOptical System Contamination: Effects, Measurements, and Control 2008 - San Diego, CA, United States
Duration: 2008 Aug 132008 Aug 14

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7069
ISSN (Print)0277-786X

Other

OtherOptical System Contamination: Effects, Measurements, and Control 2008
CountryUnited States
CitySan Diego, CA
Period08/8/1308/8/14

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Ham, S. J., Lee, H., Lee, J. M., Kim, S. W., Richards, T., & Lockwood, M. (2008). Stray light analysis of SALEX instrument. In Optical System Contamination: Effects, Measurements, and Control 2008 [70690L] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7069). https://doi.org/10.1117/12.794505