Stress effect on cycle properties of the silicon thin-film anode

Seung Joo Lee, Jong Ki Lee, Sang Hun Chung, Heon Young Lee, Sung Man Lee, Hong Koo Baik

Research output: Contribution to journalConference article

117 Citations (Scopus)

Abstract

Si thin-film electrodes were deposited by rf magnetron sputtering method, and stress variation during charge and discharge process was measured. When Si reacts with Li forming several alloy phases sequentially, large volume expansion occurs inducing compressive stress. On Li insertion to 0 V, the formation of Li4.4Si phase, which have a volume three or four times larger than Si, causes a microcracking in the electrode, thereby the cycle performance is deteriorated. However, by limiting the lower cut-off voltage to 0.1 V, the cyclability was improved significantly. This is attributed to the reduction of the crack formation due to volume expansion, as inferred from the stress variation profile.

Original languageEnglish
Pages (from-to)191-193
Number of pages3
JournalJournal of Power Sources
Volume97-98
DOIs
Publication statusPublished - 2001 Jul 1
Event10th International Meeting on Lithium Batteries - Como, Italy
Duration: 2001 May 282001 Jun 2

Fingerprint

Silicon
Anodes
anodes
Thin films
Microcracking
cycles
Electrodes
silicon
thin films
Compressive stress
Crack initiation
Magnetron sputtering
expansion
electrodes
crack initiation
insertion
magnetron sputtering
Electric potential
cut-off
causes

All Science Journal Classification (ASJC) codes

  • Renewable Energy, Sustainability and the Environment
  • Energy Engineering and Power Technology
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

Cite this

Lee, Seung Joo ; Lee, Jong Ki ; Chung, Sang Hun ; Lee, Heon Young ; Lee, Sung Man ; Baik, Hong Koo. / Stress effect on cycle properties of the silicon thin-film anode. In: Journal of Power Sources. 2001 ; Vol. 97-98. pp. 191-193.
@article{dbb11184e5e445e39a9e407855d2bae7,
title = "Stress effect on cycle properties of the silicon thin-film anode",
abstract = "Si thin-film electrodes were deposited by rf magnetron sputtering method, and stress variation during charge and discharge process was measured. When Si reacts with Li forming several alloy phases sequentially, large volume expansion occurs inducing compressive stress. On Li insertion to 0 V, the formation of Li4.4Si phase, which have a volume three or four times larger than Si, causes a microcracking in the electrode, thereby the cycle performance is deteriorated. However, by limiting the lower cut-off voltage to 0.1 V, the cyclability was improved significantly. This is attributed to the reduction of the crack formation due to volume expansion, as inferred from the stress variation profile.",
author = "Lee, {Seung Joo} and Lee, {Jong Ki} and Chung, {Sang Hun} and Lee, {Heon Young} and Lee, {Sung Man} and Baik, {Hong Koo}",
year = "2001",
month = "7",
day = "1",
doi = "10.1016/S0378-7753(01)00761-3",
language = "English",
volume = "97-98",
pages = "191--193",
journal = "Journal of Power Sources",
issn = "0378-7753",
publisher = "Elsevier",

}

Stress effect on cycle properties of the silicon thin-film anode. / Lee, Seung Joo; Lee, Jong Ki; Chung, Sang Hun; Lee, Heon Young; Lee, Sung Man; Baik, Hong Koo.

In: Journal of Power Sources, Vol. 97-98, 01.07.2001, p. 191-193.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Stress effect on cycle properties of the silicon thin-film anode

AU - Lee, Seung Joo

AU - Lee, Jong Ki

AU - Chung, Sang Hun

AU - Lee, Heon Young

AU - Lee, Sung Man

AU - Baik, Hong Koo

PY - 2001/7/1

Y1 - 2001/7/1

N2 - Si thin-film electrodes were deposited by rf magnetron sputtering method, and stress variation during charge and discharge process was measured. When Si reacts with Li forming several alloy phases sequentially, large volume expansion occurs inducing compressive stress. On Li insertion to 0 V, the formation of Li4.4Si phase, which have a volume three or four times larger than Si, causes a microcracking in the electrode, thereby the cycle performance is deteriorated. However, by limiting the lower cut-off voltage to 0.1 V, the cyclability was improved significantly. This is attributed to the reduction of the crack formation due to volume expansion, as inferred from the stress variation profile.

AB - Si thin-film electrodes were deposited by rf magnetron sputtering method, and stress variation during charge and discharge process was measured. When Si reacts with Li forming several alloy phases sequentially, large volume expansion occurs inducing compressive stress. On Li insertion to 0 V, the formation of Li4.4Si phase, which have a volume three or four times larger than Si, causes a microcracking in the electrode, thereby the cycle performance is deteriorated. However, by limiting the lower cut-off voltage to 0.1 V, the cyclability was improved significantly. This is attributed to the reduction of the crack formation due to volume expansion, as inferred from the stress variation profile.

UR - http://www.scopus.com/inward/record.url?scp=17644438031&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=17644438031&partnerID=8YFLogxK

U2 - 10.1016/S0378-7753(01)00761-3

DO - 10.1016/S0378-7753(01)00761-3

M3 - Conference article

AN - SCOPUS:17644438031

VL - 97-98

SP - 191

EP - 193

JO - Journal of Power Sources

JF - Journal of Power Sources

SN - 0378-7753

ER -