Structural and electrical properties of Nd2Ti2O 7/Y2O3/Si structures through interface treatment

Chang Ki Lee, Woo Sik Kim, Hyung-Ho Park

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The control of thermal treatment of Y2O3 barrier layer for its phase formation was revealed to be able to control the interface between Y2O3 barrier and Si substrate. Through annealing at 800 °C for 30 min under O2 ambient, the thinnest interfacial layer containing Y-silicate and SiO2 phases was formed with Nd 2Ti2O7(NTO) film deposited on an unannealed Y2O3/Si system. However, when the crystallization of NTO film is done on the crystalline Y2O3 substrate, a growth direction of 〈100〉 becomes dominant due to the lattice matching relationship between NTO and Y2O3. The crystallinity of Y2O3 barrier was found to control the degree of 〈100〉 preferred orientation of NTO film and a memory window value of NTO/Y2O3/Si system could be controlled, i.e., in case of applying to ferroelectric gate system, the largest memory window of NTO film is possible with the highest degree of 〈100〉 growth orientation. The electrical breakdown was found to initiate at the interfacial layer between the Y2O3 barrier and Si substrate, and a calculated effective electric field for the breakdown was almost uniform even with the change of anneal procedure.

Original languageEnglish
Pages (from-to)155-159
Number of pages5
JournalThin Solid Films
Volume464-465
DOIs
Publication statusPublished - 2004 Oct 1

Fingerprint

Structural properties
Electric properties
electrical properties
Substrates
Data storage equipment
Silicates
barrier layers
Crystallization
electrical faults
Ferroelectric materials
silicates
crystallinity
breakdown
Heat treatment
Electric fields
Annealing
crystallization
Crystalline materials
annealing
electric fields

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

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title = "Structural and electrical properties of Nd2Ti2O 7/Y2O3/Si structures through interface treatment",
abstract = "The control of thermal treatment of Y2O3 barrier layer for its phase formation was revealed to be able to control the interface between Y2O3 barrier and Si substrate. Through annealing at 800 °C for 30 min under O2 ambient, the thinnest interfacial layer containing Y-silicate and SiO2 phases was formed with Nd 2Ti2O7(NTO) film deposited on an unannealed Y2O3/Si system. However, when the crystallization of NTO film is done on the crystalline Y2O3 substrate, a growth direction of 〈100〉 becomes dominant due to the lattice matching relationship between NTO and Y2O3. The crystallinity of Y2O3 barrier was found to control the degree of 〈100〉 preferred orientation of NTO film and a memory window value of NTO/Y2O3/Si system could be controlled, i.e., in case of applying to ferroelectric gate system, the largest memory window of NTO film is possible with the highest degree of 〈100〉 growth orientation. The electrical breakdown was found to initiate at the interfacial layer between the Y2O3 barrier and Si substrate, and a calculated effective electric field for the breakdown was almost uniform even with the change of anneal procedure.",
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Structural and electrical properties of Nd2Ti2O 7/Y2O3/Si structures through interface treatment. / Lee, Chang Ki; Kim, Woo Sik; Park, Hyung-Ho.

In: Thin Solid Films, Vol. 464-465, 01.10.2004, p. 155-159.

Research output: Contribution to journalArticle

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