Structural characteristics of Y2O3 films grown on oxidized Si(111) surface

M. H. Cho, D. H. Ko, Y. K. Choi, I. W. Lyo, K. Jeong, T. G. Kim, J. H. Song, C. N. Whang

Research output: Contribution to journal › Article › peer-review

33 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Structural characteristics of Y2O3 films grown on oxidized Si(111) surface'. Together they form a unique fingerprint.

Physics

Material Science