Structural characterization of partially crystallized phases embedded in low temperature MOCVD-grown PbTiO3 thin films

Chae Hyun Wang, Doo Jin Choi

Research output: Contribution to journalArticle

Abstract

The structural properties of metallorganic chemical vapour deposition (MOCVD) grown lead titanate thin films were investigated. The transmission electron microscopy (TEM) analysis showed that the film was composed of microcrystalline phase, irregular shaped grains of 300 nm-700 nm, and nanocrystallites. The analysis revealed that the amorphous region crystallized from the nanocrystalline seed to polycrystalline lead titanate phase during the post-growth annealing.

Original languageEnglish
Pages (from-to)1505-1508
Number of pages4
JournalJournal of Materials Science Letters
Volume19
Issue number17
DOIs
Publication statusPublished - 2000 Jan 1

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Metallorganic chemical vapor deposition
Lead
Thin films
Nanocrystallites
Seed
Structural properties
Annealing
Transmission electron microscopy
Temperature
lead titanate

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

Cite this

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abstract = "The structural properties of metallorganic chemical vapour deposition (MOCVD) grown lead titanate thin films were investigated. The transmission electron microscopy (TEM) analysis showed that the film was composed of microcrystalline phase, irregular shaped grains of 300 nm-700 nm, and nanocrystallites. The analysis revealed that the amorphous region crystallized from the nanocrystalline seed to polycrystalline lead titanate phase during the post-growth annealing.",
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Structural characterization of partially crystallized phases embedded in low temperature MOCVD-grown PbTiO3 thin films. / Wang, Chae Hyun; Choi, Doo Jin.

In: Journal of Materials Science Letters, Vol. 19, No. 17, 01.01.2000, p. 1505-1508.

Research output: Contribution to journalArticle

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