Structural, optical and secondary electron emission properties of MgO and Mg-O-Cs thin films prepared by ion beam assisted deposition

Soon Joon Rho, Soon Moon Jeong, Hong Koo Baik, Kie Moon Song

Research output: Contribution to journalConference article

27 Citations (Scopus)

Abstract

Energetic oxygen ion bombardment induces densification and enhances the film crystallinity and refractive index of the evaporated MgO thin films. The optimum oxygen ion bombardment energy is 100 eV and its energy shows have the highest crystallinity and optical properties. The oxygen ion bombardment affects the optical properties that are dependent on the structural properties of the MgO thin films. The ion-induced secondary electron emission property is enhanced more by the cesium incorporation than by the ion beam assisted deposition. This phenomenon is a combined effect of densification of the structure and the reduction of the surface work function.

Original languageEnglish
Pages (from-to)55-59
Number of pages5
JournalThin Solid Films
Volume355
DOIs
Publication statusPublished - 1999 Nov 1
EventProceedings of the 1999 26th International Conference on Metallurgic Coatings and Thin Films - San Diego, CA, USA
Duration: 1999 Apr 121999 Apr 15

Fingerprint

Ion beam assisted deposition
Electron emission
secondary emission
Ion bombardment
oxygen ions
electron emission
bombardment
ion beams
densification
Oxygen
Densification
Thin films
crystallinity
thin films
Optical properties
optical properties
Cesium
cesium
Structural properties
Refractive index

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

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abstract = "Energetic oxygen ion bombardment induces densification and enhances the film crystallinity and refractive index of the evaporated MgO thin films. The optimum oxygen ion bombardment energy is 100 eV and its energy shows have the highest crystallinity and optical properties. The oxygen ion bombardment affects the optical properties that are dependent on the structural properties of the MgO thin films. The ion-induced secondary electron emission property is enhanced more by the cesium incorporation than by the ion beam assisted deposition. This phenomenon is a combined effect of densification of the structure and the reduction of the surface work function.",
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Structural, optical and secondary electron emission properties of MgO and Mg-O-Cs thin films prepared by ion beam assisted deposition. / Rho, Soon Joon; Jeong, Soon Moon; Baik, Hong Koo; Song, Kie Moon.

In: Thin Solid Films, Vol. 355, 01.11.1999, p. 55-59.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Structural, optical and secondary electron emission properties of MgO and Mg-O-Cs thin films prepared by ion beam assisted deposition

AU - Rho, Soon Joon

AU - Jeong, Soon Moon

AU - Baik, Hong Koo

AU - Song, Kie Moon

PY - 1999/11/1

Y1 - 1999/11/1

N2 - Energetic oxygen ion bombardment induces densification and enhances the film crystallinity and refractive index of the evaporated MgO thin films. The optimum oxygen ion bombardment energy is 100 eV and its energy shows have the highest crystallinity and optical properties. The oxygen ion bombardment affects the optical properties that are dependent on the structural properties of the MgO thin films. The ion-induced secondary electron emission property is enhanced more by the cesium incorporation than by the ion beam assisted deposition. This phenomenon is a combined effect of densification of the structure and the reduction of the surface work function.

AB - Energetic oxygen ion bombardment induces densification and enhances the film crystallinity and refractive index of the evaporated MgO thin films. The optimum oxygen ion bombardment energy is 100 eV and its energy shows have the highest crystallinity and optical properties. The oxygen ion bombardment affects the optical properties that are dependent on the structural properties of the MgO thin films. The ion-induced secondary electron emission property is enhanced more by the cesium incorporation than by the ion beam assisted deposition. This phenomenon is a combined effect of densification of the structure and the reduction of the surface work function.

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U2 - 10.1016/S0040-6090(99)00442-3

DO - 10.1016/S0040-6090(99)00442-3

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EP - 59

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

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