Structured Set Matching Networks for One-Shot Part Labeling

Jonghyun Choi, Jayant Krishnamurthy, Aniruddha Kembhavi, Ali Farhadi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

Diagrams often depict complex phenomena and serve as a good test bed for visual and textual reasoning. However, understanding diagrams using natural image understanding approaches requires large training datasets of diagrams, which are very hard to obtain. Instead, this can be addressed as a matching problem either between labeled diagrams, images or both. This problem is very challenging since the absence of significant color and texture renders local cues ambiguous and requires global reasoning. We consider the problem of one-shot part labeling: labeling multiple parts of an object in a target image given only a single source image of that category. For this set-to-set matching problem, we introduce the Structured Set Matching Network (SSMN), a structured prediction model that incorporates convolutional neural networks. The SSMN is trained using global normalization to maximize local match scores between corresponding elements and a global consistency score among all matched elements, while also enforcing a matching constraint between the two sets. The SSMN significantly outperforms several strong baselines on three label transfer scenarios: diagram-to-diagram, evaluated on a new diagram dataset of over 200 categories; image-to-image, evaluated on a dataset built on top of the Pascal Part Dataset; and image-to-diagram, evaluated on transferring labels across these datasets.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2018
PublisherIEEE Computer Society
Pages3627-3636
Number of pages10
ISBN (Electronic)9781538664209
DOIs
Publication statusPublished - 2018 Dec 14
Event31st Meeting of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2018 - Salt Lake City, United States
Duration: 2018 Jun 182018 Jun 22

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919

Conference

Conference31st Meeting of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2018
Country/TerritoryUnited States
CitySalt Lake City
Period18/6/1818/6/22

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

All Science Journal Classification (ASJC) codes

  • Software
  • Computer Vision and Pattern Recognition

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