Active control technology of particles in a microchannel using optical force, is an area of interest to scientists in various field today. The optical force is generated by momentum change caused by refraction and reflection of light. The generated optical force changes the surface of the particle to change the angle of incidence of light, so that the force generated by the change in the momentum of light changes. Interpreting this technique through simulation is a complex task. The deformation of a particle, interaction between the surrounding fluid and particle, and reflection and refection of light need to be analyzed simultaneously to be simulated. In this study, a deformable particle in a microchannel with optical sources was simulated with a three-dimensional lattice Boltzmann immersed boundary method. The beam originating from the optical source is analyzed by dividing it into individual ray. To calculate the optical forces acting on the particle, the intensity, momentum and direction of ray were calculated. First, the optical separator problem with one optical source was analyzed by measuring the distance traveled by the optical force. Second, the optical stretcher problem with two optical sources was studied by analyzing the relationship between the intensity of the optical source and the deformation of the particles.
|Title of host publication||Optical Trapping and Optical Micromanipulation XV|
|Editors||Gabriel C. Spalding, Kishan Dholakia|
|Publication status||Published - 2018|
|Event||Optical Trapping and Optical Micromanipulation XV 2018 - San Diego, United States|
Duration: 2018 Aug 19 → 2018 Aug 23
|Name||Proceedings of SPIE - The International Society for Optical Engineering|
|Conference||Optical Trapping and Optical Micromanipulation XV 2018|
|Period||18/8/19 → 18/8/23|
Bibliographical noteFunding Information:
This work was supported by the Advanced Research Center Program (NRF-2015R1A5A1037668) through a National Research Foundation of Korea (NRF) grant funded by the Ministry of Science, ICT, and Future Planning (MSIP).
© 2018 SPIE.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering