Study of TiSe 2/NbSe 2 superlattices with scanning transmission X-ray microscopy

Hyun Joon Shin, Kwangho Jeong, David C. Johnson, Stephen D. Kevan, Myungkeun Noh, Tony Warwick

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

A scanning transmission X-ray microscope (STXM) has been applied to study TiSe 2/NbSe 2 superlattices crystallized from an elementally modulated film. The STXM images show that the superlattice sample has structures with sizes on the order of one micrometer in the x-y plane. X-ray absorption spectra (XAS) show that the titanium in the structure is in the form of a mixture of crystalline TiSe 2 and metallic Ti. The structure shows interfacial nucleation of the layers in the kinetic trapping method with different domain sizes for different sets of TiSe 2 and NbSe 2 layer numbers in a unit-cell. The XAS obtained using the STXM provide detailed chemical and structural information generally not available using conventional total electron yield detection.

Original languageEnglish
Pages (from-to)575-579
Number of pages5
JournalJournal of the Korean Physical Society
Volume30
Issue number3
Publication statusPublished - 1997

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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