Study of TiSe 2/NbSe 2 superlattices with scanning transmission X-ray microscopy

Hyun Joon Shin, Kwangho Jeong, David C. Johnson, Stephen D. Kevan, Myungkeun Noh, Tony Warwick

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A scanning transmission X-ray microscope (STXM) has been applied to study TiSe 2/NbSe 2 superlattices crystallized from an elementally modulated film. The STXM images show that the superlattice sample has structures with sizes on the order of one micrometer in the x-y plane. X-ray absorption spectra (XAS) show that the titanium in the structure is in the form of a mixture of crystalline TiSe 2 and metallic Ti. The structure shows interfacial nucleation of the layers in the kinetic trapping method with different domain sizes for different sets of TiSe 2 and NbSe 2 layer numbers in a unit-cell. The XAS obtained using the STXM provide detailed chemical and structural information generally not available using conventional total electron yield detection.

Original languageEnglish
Pages (from-to)575-579
Number of pages5
JournalJournal of the Korean Physical Society
Issue number3
Publication statusPublished - 1997 Dec 1

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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    Shin, H. J., Jeong, K., Johnson, D. C., Kevan, S. D., Noh, M., & Warwick, T. (1997). Study of TiSe 2/NbSe 2 superlattices with scanning transmission X-ray microscopy. Journal of the Korean Physical Society, 30(3), 575-579.