Study of TiSe 2/NbSe 2 superlattices with scanning transmission X-ray microscopy

Hyun Joon Shin; Kwangho Jeong; David C. Johnson; Stephen D. Kevan; Myungkeun Noh; Tony Warwick

Study of TiSe ₂/NbSe ₂ superlattices with scanning transmission X-ray microscopy

Hyun Joon Shin, Kwangho Jeong, David C. Johnson, Stephen D. Kevan, Myungkeun Noh, Tony Warwick

Department of Physics

Research output: Contribution to journal › Article

7 Citations (Scopus)

Abstract

A scanning transmission X-ray microscope (STXM) has been applied to study TiSe ₂/NbSe ₂ superlattices crystallized from an elementally modulated film. The STXM images show that the superlattice sample has structures with sizes on the order of one micrometer in the x-y plane. X-ray absorption spectra (XAS) show that the titanium in the structure is in the form of a mixture of crystalline TiSe ₂ and metallic Ti. The structure shows interfacial nucleation of the layers in the kinetic trapping method with different domain sizes for different sets of TiSe ₂ and NbSe ₂ layer numbers in a unit-cell. The XAS obtained using the STXM provide detailed chemical and structural information generally not available using conventional total electron yield detection.

Original language	English
Pages (from-to)	575-579
Number of pages	5
Journal	Journal of the Korean Physical Society
Volume	30
Issue number	3
Publication status	Published - 1997 Dec 1

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

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Shin, H. J., Jeong, K., Johnson, D. C., Kevan, S. D., Noh, M., & Warwick, T. (1997). Study of TiSe ₂/NbSe ₂ superlattices with scanning transmission X-ray microscopy. Journal of the Korean Physical Society, 30(3), 575-579.

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abstract = "A scanning transmission X-ray microscope (STXM) has been applied to study TiSe 2/NbSe 2 superlattices crystallized from an elementally modulated film. The STXM images show that the superlattice sample has structures with sizes on the order of one micrometer in the x-y plane. X-ray absorption spectra (XAS) show that the titanium in the structure is in the form of a mixture of crystalline TiSe 2 and metallic Ti. The structure shows interfacial nucleation of the layers in the kinetic trapping method with different domain sizes for different sets of TiSe 2 and NbSe 2 layer numbers in a unit-cell. The XAS obtained using the STXM provide detailed chemical and structural information generally not available using conventional total electron yield detection.",

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AU - Shin, Hyun Joon

AU - Jeong, Kwangho

AU - Johnson, David C.

AU - Kevan, Stephen D.

AU - Noh, Myungkeun

AU - Warwick, Tony

PY - 1997/12/1

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N2 - A scanning transmission X-ray microscope (STXM) has been applied to study TiSe 2/NbSe 2 superlattices crystallized from an elementally modulated film. The STXM images show that the superlattice sample has structures with sizes on the order of one micrometer in the x-y plane. X-ray absorption spectra (XAS) show that the titanium in the structure is in the form of a mixture of crystalline TiSe 2 and metallic Ti. The structure shows interfacial nucleation of the layers in the kinetic trapping method with different domain sizes for different sets of TiSe 2 and NbSe 2 layer numbers in a unit-cell. The XAS obtained using the STXM provide detailed chemical and structural information generally not available using conventional total electron yield detection.

AB - A scanning transmission X-ray microscope (STXM) has been applied to study TiSe 2/NbSe 2 superlattices crystallized from an elementally modulated film. The STXM images show that the superlattice sample has structures with sizes on the order of one micrometer in the x-y plane. X-ray absorption spectra (XAS) show that the titanium in the structure is in the form of a mixture of crystalline TiSe 2 and metallic Ti. The structure shows interfacial nucleation of the layers in the kinetic trapping method with different domain sizes for different sets of TiSe 2 and NbSe 2 layer numbers in a unit-cell. The XAS obtained using the STXM provide detailed chemical and structural information generally not available using conventional total electron yield detection.

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