Study on the effects of zr-incorporated inzno thin-film transistors using a solution process

Tae Jeong, Si Joon Kim, Doo Hyun Yoon, Woong Hee Jeong, Dong Lim Kim, Hyun Soo Lim, Hyun Jae Kim

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

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Engineering & Materials Science

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