Study on the structural stability and charge trapping properties of High-k HfO2 and HFO2/Al2O3/HfO2 stacks

Young Soo Ahn, Min Young Huh, Hae Yoon Kang, Hyunchul Sohn

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Study on the structural stability and charge trapping properties of High-k HfO2 and HFO2/Al2O3/HfO2 stacks'. Together they form a unique fingerprint.

Material Science

Engineering

Physics

Biochemistry, Genetics and Molecular Biology

Neuroscience