TY - GEN
T1 - Super resolution imaging by nanoscale localization sampling on nanohole arrays
AU - Kim, Kyujung
AU - Oh, Youngjin
AU - Lee, Wonju
AU - Kim, Donghyun
PY - 2011
Y1 - 2011
N2 - We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.
AB - We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.
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M3 - Conference contribution
AN - SCOPUS:84893584039
SN - 9781557529176
T3 - Optics InfoBase Conference Papers
BT - Frontiers in Optics, FiO 2011
T2 - Frontiers in Optics, FiO 2011
Y2 - 16 October 2011 through 20 October 2011
ER -