Super resolution imaging by nanoscale localization sampling on nanohole arrays

Kyujung Kim, Youngjin Oh, Wonju Lee, Donghyun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.

Original languageEnglish
Title of host publicationFrontiers in Optics, FiO 2011
Publication statusPublished - 2011 Dec 1
EventFrontiers in Optics, FiO 2011 - San Jose, CA, United States
Duration: 2011 Oct 162011 Oct 20

Other

OtherFrontiers in Optics, FiO 2011
CountryUnited States
CitySan Jose, CA
Period11/10/1611/10/20

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All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Kim, K., Oh, Y., Lee, W., & Kim, D. (2011). Super resolution imaging by nanoscale localization sampling on nanohole arrays. In Frontiers in Optics, FiO 2011