Super resolution imaging by nanoscale localization sampling on nanohole arrays

Kyujung Kim; Youngjin Oh; Wonju Lee; Donghyun Kim

Super resolution imaging by nanoscale localization sampling on nanohole arrays

Kyujung Kim, Youngjin Oh, Wonju Lee, Donghyun Kim

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.

Original language	English
Title of host publication	Laser Science, LS 2011
Publication status	Published - 2011 Dec 1
Event	Laser Science, LS 2011 - San Jose, CA, United States Duration: 2011 Oct 16 → 2011 Oct 20

Other

Other	Laser Science, LS 2011
Country	United States
City	San Jose, CA
Period	11/10/16 → 11/10/20

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics

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title = "Super resolution imaging by nanoscale localization sampling on nanohole arrays",

abstract = "We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.",

author = "Kyujung Kim and Youngjin Oh and Wonju Lee and Donghyun Kim",

year = "2011",

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day = "1",

language = "English",

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booktitle = "Laser Science, LS 2011",

note = "Laser Science, LS 2011 ; Conference date: 16-10-2011 Through 20-10-2011",

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T1 - Super resolution imaging by nanoscale localization sampling on nanohole arrays

AU - Kim, Kyujung

AU - Oh, Youngjin

AU - Lee, Wonju

AU - Kim, Donghyun

PY - 2011/12/1

Y1 - 2011/12/1

N2 - We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.

AB - We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.

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M3 - Conference contribution

SN - 9781557529176

BT - Laser Science, LS 2011

T2 - Laser Science, LS 2011

Y2 - 16 October 2011 through 20 October 2011

ER -