Abstract
We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.
| Original language | English |
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| Title of host publication | Laser Science, LS 2011 |
| Publication status | Published - 2011 Dec 1 |
| Event | Laser Science, LS 2011 - San Jose, CA, United States Duration: 2011 Oct 16 → 2011 Oct 20 |
Other
| Other | Laser Science, LS 2011 |
|---|---|
| Country | United States |
| City | San Jose, CA |
| Period | 11/10/16 → 11/10/20 |
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All Science Journal Classification (ASJC) codes
- Instrumentation
- Atomic and Molecular Physics, and Optics
Cite this
Kim, K., Oh, Y., Lee, W., & Kim, D. (2011). Super resolution imaging by nanoscale localization sampling on nanohole arrays. In Laser Science, LS 2011