Abstract
We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.
Original language | English |
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Title of host publication | Laser Science, LS 2011 |
Publication status | Published - 2011 Dec 1 |
Event | Laser Science, LS 2011 - San Jose, CA, United States Duration: 2011 Oct 16 → 2011 Oct 20 |
Other
Other | Laser Science, LS 2011 |
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Country/Territory | United States |
City | San Jose, CA |
Period | 11/10/16 → 11/10/20 |
All Science Journal Classification (ASJC) codes
- Instrumentation
- Atomic and Molecular Physics, and Optics