Surface-plasmon enhanced microscopy has been investigated using blocked random nanodot arrays. J744 cells were imaged on blocked nanodot arrays under total internal reflection. The images were deconvolved based on localized near-field distribution for super-resolution. Experimentally achieved resolution is estimated to be 100-150 nm. Effects of signal-to-noise and registration on the reconstructed images are discussed.
|Title of host publication||2015 Opto-Electronics and Communications Conference, OECC 2015|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Publication status||Published - 2015 Nov 30|
|Event||Opto-Electronics and Communications Conference, OECC 2015 - Shanghai, China|
Duration: 2015 Jun 28 → 2015 Jul 2
|Name||2015 Opto-Electronics and Communications Conference, OECC 2015|
|Other||Opto-Electronics and Communications Conference, OECC 2015|
|Period||15/6/28 → 15/7/2|
Bibliographical notePublisher Copyright:
© 2015 IEEE.
All Science Journal Classification (ASJC) codes
- Computer Networks and Communications
- Electrical and Electronic Engineering