Surface-plasmon enhanced microscopy using blocked silver nanodot arrays

Taehwang Son, Yongjin Oh, Wonju Lee, Heejin Yang, Donghyun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Surface-plasmon enhanced microscopy has been investigated using blocked random nanodot arrays. J744 cells were imaged on blocked nanodot arrays under total internal reflection. The images were deconvolved based on localized near-field distribution for super-resolution. Experimentally achieved resolution is estimated to be 100-150 nm. Effects of signal-to-noise and registration on the reconstructed images are discussed.

Original languageEnglish
Title of host publication2015 Opto-Electronics and Communications Conference, OECC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467379441
DOIs
Publication statusPublished - 2015 Nov 30
EventOpto-Electronics and Communications Conference, OECC 2015 - Shanghai, China
Duration: 2015 Jun 282015 Jul 2

Publication series

Name2015 Opto-Electronics and Communications Conference, OECC 2015

Other

OtherOpto-Electronics and Communications Conference, OECC 2015
CountryChina
CityShanghai
Period15/6/2815/7/2

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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    Son, T., Oh, Y., Lee, W., Yang, H., & Kim, D. (2015). Surface-plasmon enhanced microscopy using blocked silver nanodot arrays. In 2015 Opto-Electronics and Communications Conference, OECC 2015 [7340192] (2015 Opto-Electronics and Communications Conference, OECC 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OECC.2015.7340192