Surface-plasmon enhanced microscopy using blocked silver nanodot arrays

Taehwang Son; Yongjin Oh; Wonju Lee; Heejin Yang; Donghyun Kim

doi:10.1109/OECC.2015.7340192

Surface-plasmon enhanced microscopy using blocked silver nanodot arrays

Taehwang Son, Yongjin Oh, Wonju Lee, Heejin Yang, Donghyun Kim

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Surface-plasmon enhanced microscopy has been investigated using blocked random nanodot arrays. J744 cells were imaged on blocked nanodot arrays under total internal reflection. The images were deconvolved based on localized near-field distribution for super-resolution. Experimentally achieved resolution is estimated to be 100-150 nm. Effects of signal-to-noise and registration on the reconstructed images are discussed.

Original language	English
Title of host publication	2015 Opto-Electronics and Communications Conference, OECC 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781467379441
DOIs	https://doi.org/10.1109/OECC.2015.7340192
Publication status	Published - 2015 Nov 30
Event	Opto-Electronics and Communications Conference, OECC 2015 - Shanghai, China Duration: 2015 Jun 28 → 2015 Jul 2

Publication series

Name	2015 Opto-Electronics and Communications Conference, OECC 2015

Other

Other	Opto-Electronics and Communications Conference, OECC 2015
Country/Territory	China
City	Shanghai
Period	15/6/28 → 15/7/2

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

All Science Journal Classification (ASJC) codes

Computer Networks and Communications
Electrical and Electronic Engineering

Access to Document

10.1109/OECC.2015.7340192

Cite this

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title = "Surface-plasmon enhanced microscopy using blocked silver nanodot arrays",

abstract = "Surface-plasmon enhanced microscopy has been investigated using blocked random nanodot arrays. J744 cells were imaged on blocked nanodot arrays under total internal reflection. The images were deconvolved based on localized near-field distribution for super-resolution. Experimentally achieved resolution is estimated to be 100-150 nm. Effects of signal-to-noise and registration on the reconstructed images are discussed.",

author = "Taehwang Son and Yongjin Oh and Wonju Lee and Heejin Yang and Donghyun Kim",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; Opto-Electronics and Communications Conference, OECC 2015 ; Conference date: 28-06-2015 Through 02-07-2015",

year = "2015",

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doi = "10.1109/OECC.2015.7340192",

language = "English",

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Son, T, Oh, Y, Lee, W, Yang, H & Kim, D 2015, Surface-plasmon enhanced microscopy using blocked silver nanodot arrays. in 2015 Opto-Electronics and Communications Conference, OECC 2015., 7340192, 2015 Opto-Electronics and Communications Conference, OECC 2015, Institute of Electrical and Electronics Engineers Inc., Opto-Electronics and Communications Conference, OECC 2015, Shanghai, China, 15/6/28. https://doi.org/10.1109/OECC.2015.7340192

Surface-plasmon enhanced microscopy using blocked silver nanodot arrays. / Son, Taehwang; Oh, Yongjin; Lee, Wonju et al.

2015 Opto-Electronics and Communications Conference, OECC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7340192 (2015 Opto-Electronics and Communications Conference, OECC 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - Surface-plasmon enhanced microscopy using blocked silver nanodot arrays

AU - Son, Taehwang

AU - Oh, Yongjin

AU - Lee, Wonju

AU - Yang, Heejin

AU - Kim, Donghyun

PY - 2015/11/30

Y1 - 2015/11/30

N2 - Surface-plasmon enhanced microscopy has been investigated using blocked random nanodot arrays. J744 cells were imaged on blocked nanodot arrays under total internal reflection. The images were deconvolved based on localized near-field distribution for super-resolution. Experimentally achieved resolution is estimated to be 100-150 nm. Effects of signal-to-noise and registration on the reconstructed images are discussed.

AB - Surface-plasmon enhanced microscopy has been investigated using blocked random nanodot arrays. J744 cells were imaged on blocked nanodot arrays under total internal reflection. The images were deconvolved based on localized near-field distribution for super-resolution. Experimentally achieved resolution is estimated to be 100-150 nm. Effects of signal-to-noise and registration on the reconstructed images are discussed.

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M3 - Conference contribution

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T3 - 2015 Opto-Electronics and Communications Conference, OECC 2015

BT - 2015 Opto-Electronics and Communications Conference, OECC 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - Opto-Electronics and Communications Conference, OECC 2015

Y2 - 28 June 2015 through 2 July 2015

ER -

Surface-plasmon enhanced microscopy using blocked silver nanodot arrays

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