Surface plasmon enhanced super-resolution microscopy using random nanoisland patterns

Youngjin Oh, Wonju Lee, Jong Ryul Choi, Donghyun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We explore super-resolution microscopy by exciting and localizing surface plasmon on random distributions of metallic nanoisland patterns. Enhanced imaging resolution is presented from both theoretical and experimental perspectives. Also discussed are the implications of the concept in other applications.

Original languageEnglish
Title of host publicationFrontiers in Optics, FIO 2013
PublisherOptical Society of America
ISBN (Print)9781557529879
Publication statusPublished - 2013 Jan 1
EventFrontiers in Optics, FIO 2013 - Orlando, FL, United States
Duration: 2013 Oct 62013 Oct 10

Other

OtherFrontiers in Optics, FIO 2013
CountryUnited States
CityOrlando, FL
Period13/10/613/10/10

Fingerprint

Microscopic examination
microscopy
Imaging techniques
statistical distributions

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Oh, Y., Lee, W., Choi, J. R., & Kim, D. (2013). Surface plasmon enhanced super-resolution microscopy using random nanoisland patterns. In Frontiers in Optics, FIO 2013 Optical Society of America.
Oh, Youngjin ; Lee, Wonju ; Choi, Jong Ryul ; Kim, Donghyun. / Surface plasmon enhanced super-resolution microscopy using random nanoisland patterns. Frontiers in Optics, FIO 2013. Optical Society of America, 2013.
@inproceedings{fc1112282adc415888363f7e9472b4b9,
title = "Surface plasmon enhanced super-resolution microscopy using random nanoisland patterns",
abstract = "We explore super-resolution microscopy by exciting and localizing surface plasmon on random distributions of metallic nanoisland patterns. Enhanced imaging resolution is presented from both theoretical and experimental perspectives. Also discussed are the implications of the concept in other applications.",
author = "Youngjin Oh and Wonju Lee and Choi, {Jong Ryul} and Donghyun Kim",
year = "2013",
month = "1",
day = "1",
language = "English",
isbn = "9781557529879",
booktitle = "Frontiers in Optics, FIO 2013",
publisher = "Optical Society of America",

}

Oh, Y, Lee, W, Choi, JR & Kim, D 2013, Surface plasmon enhanced super-resolution microscopy using random nanoisland patterns. in Frontiers in Optics, FIO 2013. Optical Society of America, Frontiers in Optics, FIO 2013, Orlando, FL, United States, 13/10/6.

Surface plasmon enhanced super-resolution microscopy using random nanoisland patterns. / Oh, Youngjin; Lee, Wonju; Choi, Jong Ryul; Kim, Donghyun.

Frontiers in Optics, FIO 2013. Optical Society of America, 2013.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Surface plasmon enhanced super-resolution microscopy using random nanoisland patterns

AU - Oh, Youngjin

AU - Lee, Wonju

AU - Choi, Jong Ryul

AU - Kim, Donghyun

PY - 2013/1/1

Y1 - 2013/1/1

N2 - We explore super-resolution microscopy by exciting and localizing surface plasmon on random distributions of metallic nanoisland patterns. Enhanced imaging resolution is presented from both theoretical and experimental perspectives. Also discussed are the implications of the concept in other applications.

AB - We explore super-resolution microscopy by exciting and localizing surface plasmon on random distributions of metallic nanoisland patterns. Enhanced imaging resolution is presented from both theoretical and experimental perspectives. Also discussed are the implications of the concept in other applications.

UR - http://www.scopus.com/inward/record.url?scp=84898667074&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84898667074&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781557529879

BT - Frontiers in Optics, FIO 2013

PB - Optical Society of America

ER -

Oh Y, Lee W, Choi JR, Kim D. Surface plasmon enhanced super-resolution microscopy using random nanoisland patterns. In Frontiers in Optics, FIO 2013. Optical Society of America. 2013