In this Letter, we describe spatially switched surface plasmon microscopy (ssSPM) based on two-channel momentum sampling. The performance evaluated with periodic nanowires in comparison with conventional SPM and bright-field microscopy shows that the resolution of ssSPM is enhanced by almost 15 times over conventional SPM. ssSPM provides an extremely simple way to attain diffraction limit in SPM and to go beyond for super-resolution in label-free microscopy techniques.
Bibliographical noteFunding Information:
National Research Foundation of Korea (NRF) (2015R1A2A1A10052826).
© 2018 Optical Society of America
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics