Abstract
In this Letter, we describe spatially switched surface plasmon microscopy (ssSPM) based on two-channel momentum sampling. The performance evaluated with periodic nanowires in comparison with conventional SPM and bright-field microscopy shows that the resolution of ssSPM is enhanced by almost 15 times over conventional SPM. ssSPM provides an extremely simple way to attain diffraction limit in SPM and to go beyond for super-resolution in label-free microscopy techniques.
| Original language | English |
|---|---|
| Pages (from-to) | 959-962 |
| Number of pages | 4 |
| Journal | Optics Letters |
| Volume | 43 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2018 Feb 1 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
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Son, T., Lee, C., Seo, J., Choi, I. H., & Kim, D. (2018). Surface plasmon microscopy by spatial light switching for label-free imaging with enhanced resolution. Optics Letters, 43(4), 959-962. https://doi.org/10.1364/OL.43.000959