Surface plasmon microscopy by spatial light switching for label-free imaging with enhanced resolution

Taehwang Son, Changhun Lee, Jinwon Seo, In Hong Choi, Donghyun Kim

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

In this Letter, we describe spatially switched surface plasmon microscopy (ssSPM) based on two-channel momentum sampling. The performance evaluated with periodic nanowires in comparison with conventional SPM and bright-field microscopy shows that the resolution of ssSPM is enhanced by almost 15 times over conventional SPM. ssSPM provides an extremely simple way to attain diffraction limit in SPM and to go beyond for super-resolution in label-free microscopy techniques.

Original languageEnglish
Pages (from-to)959-962
Number of pages4
JournalOptics Letters
Volume43
Issue number4
DOIs
Publication statusPublished - 2018 Feb 1

Fingerprint

microscopy
nanowires
sampling
momentum
diffraction

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Son, Taehwang ; Lee, Changhun ; Seo, Jinwon ; Choi, In Hong ; Kim, Donghyun. / Surface plasmon microscopy by spatial light switching for label-free imaging with enhanced resolution. In: Optics Letters. 2018 ; Vol. 43, No. 4. pp. 959-962.
@article{4c8df84aee18405cbb1ee416b9416c07,
title = "Surface plasmon microscopy by spatial light switching for label-free imaging with enhanced resolution",
abstract = "In this Letter, we describe spatially switched surface plasmon microscopy (ssSPM) based on two-channel momentum sampling. The performance evaluated with periodic nanowires in comparison with conventional SPM and bright-field microscopy shows that the resolution of ssSPM is enhanced by almost 15 times over conventional SPM. ssSPM provides an extremely simple way to attain diffraction limit in SPM and to go beyond for super-resolution in label-free microscopy techniques.",
author = "Taehwang Son and Changhun Lee and Jinwon Seo and Choi, {In Hong} and Donghyun Kim",
year = "2018",
month = "2",
day = "1",
doi = "10.1364/OL.43.000959",
language = "English",
volume = "43",
pages = "959--962",
journal = "Optics Letters",
issn = "0146-9592",
publisher = "The Optical Society",
number = "4",

}

Surface plasmon microscopy by spatial light switching for label-free imaging with enhanced resolution. / Son, Taehwang; Lee, Changhun; Seo, Jinwon; Choi, In Hong; Kim, Donghyun.

In: Optics Letters, Vol. 43, No. 4, 01.02.2018, p. 959-962.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Surface plasmon microscopy by spatial light switching for label-free imaging with enhanced resolution

AU - Son, Taehwang

AU - Lee, Changhun

AU - Seo, Jinwon

AU - Choi, In Hong

AU - Kim, Donghyun

PY - 2018/2/1

Y1 - 2018/2/1

N2 - In this Letter, we describe spatially switched surface plasmon microscopy (ssSPM) based on two-channel momentum sampling. The performance evaluated with periodic nanowires in comparison with conventional SPM and bright-field microscopy shows that the resolution of ssSPM is enhanced by almost 15 times over conventional SPM. ssSPM provides an extremely simple way to attain diffraction limit in SPM and to go beyond for super-resolution in label-free microscopy techniques.

AB - In this Letter, we describe spatially switched surface plasmon microscopy (ssSPM) based on two-channel momentum sampling. The performance evaluated with periodic nanowires in comparison with conventional SPM and bright-field microscopy shows that the resolution of ssSPM is enhanced by almost 15 times over conventional SPM. ssSPM provides an extremely simple way to attain diffraction limit in SPM and to go beyond for super-resolution in label-free microscopy techniques.

UR - http://www.scopus.com/inward/record.url?scp=85042034655&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85042034655&partnerID=8YFLogxK

U2 - 10.1364/OL.43.000959

DO - 10.1364/OL.43.000959

M3 - Article

AN - SCOPUS:85042034655

VL - 43

SP - 959

EP - 962

JO - Optics Letters

JF - Optics Letters

SN - 0146-9592

IS - 4

ER -