Surface plasmon microscopy by spatial light switching for label-free imaging with enhanced resolution

Taehwang Son; Changhun Lee; Jinwon Seo; In Hong Choi; Donghyun Kim

doi:10.1364/OL.43.000959

Surface plasmon microscopy by spatial light switching for label-free imaging with enhanced resolution

Taehwang Son, Changhun Lee, Jinwon Seo, In Hong Choi, Donghyun Kim

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

In this Letter, we describe spatially switched surface plasmon microscopy (ssSPM) based on two-channel momentum sampling. The performance evaluated with periodic nanowires in comparison with conventional SPM and bright-field microscopy shows that the resolution of ssSPM is enhanced by almost 15 times over conventional SPM. ssSPM provides an extremely simple way to attain diffraction limit in SPM and to go beyond for super-resolution in label-free microscopy techniques.

Original language	English
Pages (from-to)	959-962
Number of pages	4
Journal	Optics Letters
Volume	43
Issue number	4
DOIs	https://doi.org/10.1364/OL.43.000959
Publication status	Published - 2018 Feb

Bibliographical note

Funding Information:
National Research Foundation of Korea (NRF) (2015R1A2A1A10052826).

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

Access to Document

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AU - Lee, Changhun

AU - Seo, Jinwon

AU - Choi, In Hong

AU - Kim, Donghyun

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