Synthesis and electrochemical characterization of vanadium oxide on carbon nanotube film substrate for pseudocapacitor applications

Il Hwan Kim, Jae Hong Kim, Byung Won Cho, Young Ho Lee, Kwang Bum Kim

Research output: Contribution to journalArticlepeer-review

97 Citations (Scopus)

Abstract

An amorphous and hydrous vanadium oxide (V2 O5 x H2 O) thin film of approximate 6-nm thickness was electrochemically prepared onto a carbon nanotube (CNT) film substrate with a three-dimensional porous structure on a nanometer scale (denoted as a V2 O5 x H2 OCNT film electrode) for pseudocapacitor application. From cyclic voltammetry and galvanostatic discharging experiments in an organic electrolyte (LiCl O4 in propylene carbonate), the V2 O5 x H2 OCNT film electrode showed a specific Li-ion capacitance of 910 Fg at a potential scan rate of 10 mVs and a specific capacity of 540 mAhg at a current density of 10 Ag, with respect to the mass of V2 O5 x H2 O. Compared with V2 O5 x H2 O prepared onto a Pt plate substrate (denoted as a V2 O5 x H2 O thin-film electrode), the V2 O5 x H2 OCNT film electrode showed a threefold higher specific Li-ion capacitance. The improved specific Li-ion capacitance of V2 O5 x H2 O in the V2 O5 x H2 OCNT film electrode is attributed to its electrode construction comprising a very thin film of V2 O5 x H2 O on the conductive CNT film substrate with a three-dimensional nanoporous structure.

Original languageEnglish
Pages (from-to)A989-A996
JournalJournal of the Electrochemical Society
Volume153
Issue number6
DOIs
Publication statusPublished - 2006 Jan 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Renewable Energy, Sustainability and the Environment
  • Surfaces, Coatings and Films
  • Electrochemistry
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Synthesis and electrochemical characterization of vanadium oxide on carbon nanotube film substrate for pseudocapacitor applications'. Together they form a unique fingerprint.

Cite this