Tail fitting yield estimation method for resistive non-volatile memory

Taehui Na, Seung H. Kang, Seong Ook Jung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper demonstrates that the read output voltage difference between data and reference voltages in a resistive non-volatile memory is not a Gaussian distribution but composed of two Gaussian distributions. In addition, a tail fitting method is proposed to estimate a read yield with high accuracy. Monte Carlo HSPICE simulation results based on industry-compatible 45-nm model parameters show that the proposed tail fitting method improves accuracy by 5.2x and 2.5 x compared to the normal fitting and the importance sampling methods, respectively.

Original languageEnglish
Title of host publication2020 International Conference on Electronics, Information, and Communication, ICEIC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728162898
DOIs
Publication statusPublished - 2020 Jan
Event2020 International Conference on Electronics, Information, and Communication, ICEIC 2020 - Barcelona, Spain
Duration: 2020 Jan 192020 Jan 22

Publication series

Name2020 International Conference on Electronics, Information, and Communication, ICEIC 2020

Conference

Conference2020 International Conference on Electronics, Information, and Communication, ICEIC 2020
CountrySpain
CityBarcelona
Period20/1/1920/1/22

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Computer Science Applications
  • Hardware and Architecture
  • Information Systems and Management
  • Electrical and Electronic Engineering

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  • Cite this

    Na, T., Kang, S. H., & Jung, S. O. (2020). Tail fitting yield estimation method for resistive non-volatile memory. In 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020 [9051000] (2020 International Conference on Electronics, Information, and Communication, ICEIC 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICEIC49074.2020.9051000