Temperature and voltage droop-aware test scheduling during scan shift operation

Taehee Lee; Yongjoon Kim; Joon Sung Yang

doi:10.1587/elex.13.20160581

Temperature and voltage droop-aware test scheduling during scan shift operation

Taehee Lee, Yongjoon Kim, Joon Sung Yang

College of Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Hotspots and voltage droops have become critical problems during scan test. They are minimized by dynamically varying clock frequency during scan shift operation. We control average and peak temperature by adjusting the clock frequency assigned to each core. This proposed method is applied to multi-core System-on-Chip (SoC). Experimental results show that our method achieves 28% peak temperature reduction and 38% average temperature reduction.

Original language	English
Article number	20160581
Journal	ieice electronics express
Volume	13
Issue number	18
DOIs	https://doi.org/10.1587/elex.13.20160581
Publication status	Published - 2016

Bibliographical note

Publisher Copyright:
© IEICE 2016.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1587/elex.13.20160581

Cite this

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abstract = "Hotspots and voltage droops have become critical problems during scan test. They are minimized by dynamically varying clock frequency during scan shift operation. We control average and peak temperature by adjusting the clock frequency assigned to each core. This proposed method is applied to multi-core System-on-Chip (SoC). Experimental results show that our method achieves 28% peak temperature reduction and 38% average temperature reduction.",

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AB - Hotspots and voltage droops have become critical problems during scan test. They are minimized by dynamically varying clock frequency during scan shift operation. We control average and peak temperature by adjusting the clock frequency assigned to each core. This proposed method is applied to multi-core System-on-Chip (SoC). Experimental results show that our method achieves 28% peak temperature reduction and 38% average temperature reduction.

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Temperature and voltage droop-aware test scheduling during scan shift operation

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

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